FBO#2924
66 - Instruments and Laboratory Equipment
SOURCES SOUGHT - November 26, 2009
- AMD-10-SS12 - Sources Sought
COMPACT 2D SAXS (SMALL ANGLE X-RAY SCATTERING) DETECTOR SYSTEM
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- AMD-10-SS06 - Sources Sought
RECOVERY - AUTOMATED CRITICAL DIMENSION ATOMIC FORCE MICROSCOPE
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- AMD-10-SS05 - Sources Sought
RECOVERY - SUBMICROMETER NEUTRON IMAGING INSTRUMENT
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- AMD-10-SS07 - Sources Sought
RECOVERY - TRACEABLE ATOMIC FORCE MICROSCOPE
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- SS-10-SS09 - Sources Sought
RECOVERY: DUAL-BEAM SCANNING ELECTRON MICROSCOPE AND FOCUSED ION BEAM SYSTEM
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- SS-10-SS10 - Sources Sought
RECOVERY: ULTRA-HIGH RESOLUTION SCANNING ELECTRON MICROSCOPES (SEMS) AND FOCUSED ION BEAM SYSTEM
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- AMD-10-SS11 - Sources Sought
HIGH RESOLUTION SECTOR FIELD INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- AMD-10-SS04 - Sources Sought
RECOVERY - FOCUSED ION BEAM (FIB)/SCANNING ELECTRON MICROSCOPE (SEM)
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
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