SOURCES SOUGHT
66 -- MULTI-ANALYSIS SYSTEM with: Scanning electron microscopy (SEM), Auger electron spectroscopy (AES), Energy-dispersive X-ray spectroscopy (EDX), X-ray photo-electron spectroscopy (XPS), Electron beam induced current (EBIC), and Cathodoluminescence(CL)
- Notice Date
- 3/13/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-09-SS15
- Archive Date
- 4/15/2009
- Point of Contact
- Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a multi-analysis system to be used in energy research program of the Center for Nanoscale Science and Technology. The main purpose of the system is to enable a comprehensive nanoscale analysis of materials transformations at interfaces with extensive nanoscale structure such as used for photoanodes, supercapacitors, batteries electrodes, hydrogen storage materials and solar cells. After results of this market research are obtained and analyzed and specifications are developed for a multi-analysis system that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. This contemplated procurement is anticipated to utilize Recovery Act Funding if it is determined that responsible sources can satisfy the requirement. NIST has a need for a multi-analysis system that would meet the following functional requirements: The system consists of surface analysis chamber(s) connected to a glove box with a sample transfer mechanism. The setup should enable extensive analysis of chemical and electrochemical transformations of the interfaces that are carried out under conditions close to the real operating environment using analytical techniques that require high- or ultrahigh-vacuum conditions. The surface analysis chamber(s) shall be equipped with the following analytical techniques: Scanning electron microscopy (SEM) for measurement of surface morphology Auger electron spectroscopy (AES) for local determination of the material composition Energy-dispersive X-ray spectroscopy (EDX) for local determination of the material composition X-ray photo-electron spectroscopy (XPS) for local determination of oxidation state and composition Electron beam induced current (EBIC) measurements for local measurement of carrier diffusion Cathodoluminescence (CL) for local measurements of electronic structure and defects Nanomanipulator(s) enabling measurements of electrical transport in nanowires and nanotubes NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company’s size classification in any response to this notice. Companies that manufacture multi-analysis systems are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to todd.hill@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.
- Web Link
-
FedBizOpps Complete View
(https://www.fbo.gov/?s=opportunity&mode=form&id=403bcd10fde9938e03bd9f2263ff8719&tab=core&_cview=1)
- Place of Performance
- Address: NIST, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN01768945-W 20090315/090313220006-403bcd10fde9938e03bd9f2263ff8719 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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