FBO#2666
66 - Instruments and Laboratory Equipment
SOURCES SOUGHT - March 15, 2009
- AMD-09-SS15 - Sources Sought
MULTI-ANALYSIS SYSTEM WITH: SCANNING ELECTRON MICROSCOPY (SEM), AUGER ELECTRON SPECTROSCOPY (AES), ENERGY-DISPERSIVE X-RAY SPECTROSCOPY (EDX), X-RAY PHOTO-ELECTRON SPECTROSCOPY (XPS), ELECTRON BEAM INDUCED CURRENT (EBIC), AND CATHODOLUMINESCENCE(CL)
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
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