66 -- X-RAY MICROANALYSIS SYSTEM

Notice Date

June 26, 2001

Contracting Office

Bid Office, SPAWARSYSCEN, Code D21B, 53570 Silvergate Avenue, Bldg. A33, Room 0061, San Diego, CA 92152-5112

ZIP Code

92152-5112

Solicitation Number

N66001-01-Q-4754

Response Due

July 11, 2001

Point of Contact

Purchasing Agent, Ms. Gaynelle Parker, Code D212, (619) 553-0889. Contracting Officer, Ms. Sylvia Proffit, D211, (619) 553-3292.

Description

This is a combined synopsis/solicitation prepared in accordance with FAR Part 13. No RFQ will be prepared or made available for distribution. Award will be made based on responsive, responsible, and technically acceptable low bids. The Government intends to procure on a competitive basis an Energy Dispersive X-ray MicroAnalysis System in accordance with the below specifications: The system shall include a Lithium-drifted silicon (Si(Li)) x-ray detector with the following minimum specifications: 1.1. Active area of 10 square millimeters or more. 1.2. Energy resolution of 138 eV or less at Mn KA x-ray line (5.9 KeV) measured at 1,000 counts per second. 1.3. Ultra thin window capable of withstanding cycling from atmospheric pressure to high vacuum, and providing the capability to transmit X-rays from all elements down to Beryllium (Z=4). 1.4. Capable of withstanding temperature cycling from room temperature to liquid Nitrogen temperature with no degradation of energy resolution or noise. 1.5. Liquid nitrogen dewer capacity of 2.5 liters (minimum). 1.6. Automatic bias cutoff when temperature exceeds operating liquid nitrogen temperature. 1.7. Peak-to-background ratio of 15,000:1 or better. 1.8. Including all hardware and electronics needed for interfacing with the existing Hitachi S4700 Field-emission Scanning Electron Microscope (FESEM) located in Battery Ashburn North. 2.0. Microanalysis Software. 2.1. Simple one-button spectrum acquisition and display. 2.2. Manual or automatic peak identification and labeling. 2.3. Selectable color display of regions of interest. 2.4. Automatic or manual background modeling. 2.5. Automatic correction for electron beam energy, sample tilt, escape peaks, high count-rate effects, and peak overlaps. 2.6. 4096 channel multi-channel energy analyzer. 2.7. Automatic standardless deconvolution of spectra, and generation of quantitative analysis report in terms of weight and atomic percent for all selected elements. 2.8. Capability to overlap spectra with previously-accumulated or simulated spectra. 3.0. X-Ray mapping Capabilities. 3.1. Integrated beam control hardware to allow the X-Ray micronalysis system to take control of the scanning electron beam for X-ray mapping applications. 3.2. 8-to 12-bit digitization of video signals from the SEM. 3.3. Automatic or manual control of beam positioning. 3.4. Overlay of x-ray maps and electron images. 3.5. X-ray mapping collection matrices up to 1024 X 1024 pixels. 3.6. High count-rate capability to at least 10,000 cps. 3.7. User selectable processing time constants from 2.5 to 100 microseconds. 3.8. Maps displayed in color or as grey scale images. 3.9. Linescan acquisition and display capabilities. 3.10 Results easily exported and manipulated in MSOffice Excel. 4.0. Digital signal processing hardware. 4.1. 4096 channel Multi channel analyser with high-speed PCI bus interface. 4.2. Software-selectable pulse processing time constants from 2.5 to 100 microseconds. 4.3. Stabilized DC power supply and high-voltage bias supply. 4.4. Peak-shift correction for high count rate effects. 4.5. All necessary electronics, interfaces, cabling, and power supplies needed for interconnection with the Hitachi S4700 SEM. 4.6. Pentium III or equivalent (or better) computer with 32X CDROM, 128 Mb (minimum) CPU memory, 20 Gb hard drive, 16 Mb Video RAM, 17-inch color monitor, ethernet , R/W CDROM and color printer. 5.0. System Integration with the SEM. 5.1. System shall include installation and integration with the Hitachi S4700 FESEM located in Battery Ashburn North. 5.2. All hardware needed for connection to the FESEM shall be provided. 5.3. Operation of all functions shall be tested, calibrated, and demonstrated 6.0. Training. 6.1. On-site training in the basic operation of the system shall be provided at the completion of installation. 6.2. Formal training at the manufacturer's facility shall be provided for one operator. 7.0. A one-year warranty shall be provided covering all parts and services required during that period. Competitive awards may be based on evaluation criteria stipulated in the Red, Yellow, Green (RYG) Contractor Evaluation System. While price will be a significant factor in the evaluation of offers, the final contract award will be based on a combination of price and delivery, a determination of responsibility and technically acceptable low bids. No hard copies will be available. No telephone requests will be accepted. Questions may be directed to Gaynelle Parker via email: parkerg@spawar.navy.mil. Facsimile quotations may be sent to (619) 553-1062. See numbered notes from any Monday edition of the CBD. The applicable North American Industry Classification System Code (NAICS) are 333313. Note: The full text of the Federal Acquisition Regulation (FAR) can be accessed on the Internet at http://farsite.hill.af.mil/. Offerors must complete and submit with their quote, a copy of FAR 52.219-1 Alt I/II, Small Business Program Representation. Central Contractor Registration is required for resulting award. Information may be found at http://www.ccr2000.com/.

Record

Loren Data Corp. 20010628/66SOL006.HTM (W-177 SN50Q1G0)