66 -- DIGITAL X-RAY MICROANALYSIS SYSTEM

Notice Date

May 21, 2001

Contracting Office

USDA Forest Service, Forest Products Laboratory, One Gifford Pinchot Drive, Madison, WI 53705-2398

ZIP Code

53705-2398

Solicitation Number

RFQ-FPL-01-02

Response Due

June 20, 2001

Point of Contact

Shawn Lacina (608)231-9287

E-Mail Address

Contract Specialist (slacina@fs.fed.us)

Description

This is a combined synopsis / solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes only the solicitation: proposals are being requested and a written solicitation will not be issued. This request for proposals RFQ-FPL-01-02 is for providing a Digital X-Ray Microanalysis System (as described below) to be delivered FOB Destination to the USDA, Forest Service, Forest Products Laboratory, 507 Highland Ave., Madison, WI 53705-2398. Inspection and acceptance will be at destination. Offerors shall indicate time for delivery, but it is desired within 30 days ARO. When responding to this request, please indicate on your outer envelope in the lower left-hand corner; "RFQ-FPL-01-02, DUE 05/31/01, 2:00PM". The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular 97-17 (4/25/2000). They are located in Part 52 of the Federal Acquisition Regulations. They can be found on the Internet at the URL noted at the end of this notice. FAR Provision 52.212-1 (OCT 2000), Instructions to Offerors-Commercial Items, applies to this acquisition. NAICS code is 33451 with a size standard limit of 500 employees to be considered as a small business applies. This acquisition is a small business set-aside. Offerors shall include a completed copy of this provision at FAR 52.212-3 (MAY 2001), Offeror Representations and Certifications-Commercial Items, with their offer. FAR Clause 52.212-4 (MAY 2001), Contract Terms and Conditions-Commercial Items, applies to this acquisition. FAR Clause 52.212-5 (FEB 2001), Contract Terms and Conditions Required to Implement Statutes or Executive orders-Commercial Items, applies to this order and the additional clauses referenced in part (b) are items (11-16, 19, 21, 21 and 25). EVALUATION: Responses will be evaluated using simplified acquisition procedures (FAR 13.106-2). Selection will be made from best value. Note that award may be made without further discussions. The criteria will be TECHNICAL (capability of the items offered to meet the agency need with particular emphasis on meeting wood research data collection of a national federal laboratory and supplied software for instrument control.), PRICE (total price inclusive of shipping charges), WARRANTY offered, TECHNICAL SUPPORT offered (including availability of manufacturer support, service, and parts-current and future). EXPERIENCE supplying similar equipment to research laboratories (provide a list of customers that have previously purchased this equipment), and quality of PAST PERFORMANCE. QUALITY of apparatus. REMOVAL AND TRADE-IN VALUE of Government-owned old equipment consisting of one 1985 TN-5500 X-Ray Analyzer. For questions on this machine contact Thomas Kuster at (608)231-9459 between the hours of 8:30am-4:30pm, M-F. Relative importance of the criteria will be determined on a "best value" basis by the government. RESPONSES SHALL ADDRESS ALL OF THESE AREAS. Offerors shall also submit descriptive product literature and it is helpful to compare technical features against the requirements listed in the Item Description following. -- -ITEM DESCRIPTION: The USDA Forest Products Laboratory requires one complete Digital X-Ray Microanalysis system with high resolution light element detector with the following minimum instrument specifications: I. General A. Spectral imaging for full spectrum database storage and recall at every pixel. Dedicated hardware in the digital acquisition engine and PC for throughput optimization. Electron images up to 1024 x 1024 x 8. Spectral imaging database with spectral data at up to 512 x 512 x 32 bit at a resolution of 2048 channels. Scan rates up too 40 us/pixel (2.5 sec per frame) at 256 x 256. All data is dead time corrected. B. Spectral Analysis including intelligent qualitative analysis by multiple least squares peak fitting for detection of overlapped peaks. Background removal by digital top hat filter of three forms of modeling (multiple least squares fit, gaussian deconvolution, or matrix correction). Quantitative bulk matrix corrections. Standardless, mixed standards, and full standards quantitation, including light elements. Report generation integrated with Microsoft Word. Conversion of quantitative analysis results files into comma-separated-value format for importing into spreadsheet applications. Multicell display for comparing and printing up to 64 spectra in arrayed, stacked, or overlaid arrangements. Live digital ratemeter display in pie chart or bar chart format. Full width at half maximum peak calculation. Complete spectral processing, including smoothing and escape peak subtraction. Spectral math and region-of-interest ratioing. C. Simultaneous display of digital linescan and electron image with read-out of cursor position and x-ray intensity for each element. Complete control of linescan display properties, including arrangement, scaling, cursors, colors, symbols, fill modes and line weights. Kalman and exponential frame averaging. Linescan acquisition at 16K x 16K resolution of digital beam positioning electronics. Image data conversion for TIFF standard format. Image histogram analysis of one or more images or maps simultaneously. Linear distance measurement tool. Image file gallery software for managing and viewing images on disk in thumbnail format. D. Digital acquisition engine incorporating three digital signal processors. X-ray count rate throughput capability in excess of 60,000 counts with reduced dead time. Enhanced light element performance. Enhanced x-ray mapping intensities and speeds at high count rates. Optical isolation of signals to the microscope scan control to eliminate ground loops. E. 8-bit digitization (256 grey levels) per pixel. F. Energy Dispersive Spectrometer detector with light element window, 30mm2 straight Si(Li) crystal, 134eV resolution at Mn for the JEOL-JSM-840. 7.5 liter dewar and LN sensor. G. The integrated PC and software shall include: 32-bit 933MHz Pentium III with 256 Cache, 192MB RAM, 20GB hard drive, 1.44-Mbytes floppy disk drive, CD-RW drive, 250MB ZIP drive, 2 serial ports, 1 parallel port and Microsoft windows NT workstation. This unit must be customized with chassis compatible with x-ray analyzer and have integrated compatible software. Expanded 21 inch monitor featuring low EMI emission profile and flat screen. Color printer with parallel interface including 600 dpi and 12ppm performance for b/w and 300dpi and 10ppm for color mode and compatible with system. Interface cable connections for all components. H. Interface module for a JEOL 840-JSM scanning electron microscope. I. Installation and initial system training by support representative. J. Complete on-line and printed manuals including system handbook, spectral applications, imaging, mapping and linescan applications K. 12-month complete hardware and 24-month complete software warranty, including on-site support. L. Removal and trade-in of existing TN-5500 x-ray analyzer with detector. M. Training credit for one person for customer training course.

Web Link

Click here to obtain referenced FAR Provisions and (www.arnet.gov/far/)

Record

Loren Data Corp. 20010523/66SOL008.HTM (W-141 SN50M710)