J -- PREVENTATIVE MAINTENANCE SERVICE CONTRACT FOR PHILIPS XL40 FEG SCANNING ELECTRON MICROSCOPE AND ACCESSORIES

Notice Date

March 28, 2001

Contracting Office

NASA/Lyndon B. Johnson Space Center, Houston Texas, 77058-3696, Mail Code: BJ

ZIP Code

00000

Solicitation Number

9-BJ2-Z18-1-13Q

Response Due

April 11, 2001

Point of Contact

Marie D. Kliment, Contracting Officer, Phone (281) 483-4168, Fax (281) 483-2138, Email marie.d.kliment1@jsc.nasa.gov

E-Mail Address

Marie D. Kliment (marie.d.kliment1@jsc.nasa.gov)

Description

NASA/JSC plans to issue a Request for Quotation (RFQ) for a preventative maintenance service contract for the following equipment: (1) Philips XL40 FEG Scanning Electron Microscope (XL40FEGI), (2) Infrared Camera Addition (5244XL), (3) Backscatter Electron System Addition (5235XL), (4) Photomonitor Addition (5238XL), and (5) Turbomolecular Pump (5211). The basic period of performance will begin April 12, 2001, through April 11, 2002. Four additional annual extensions are anticipated. The maintenance service contract includes, but is not limited to, preventative maintenance checks per year at regularly scheduled intervals, unlimited corrective maintenance visits for normal problems that may arise in the interim,unlimited technical phone support, parts coverage specified for each listed item above; and guaranteed response times. This procurement is being conducted under the Simplified Acquisition Procedures (SAP). NASA/JSC intends to purchase the preventative service agreement from FEI Company (formerly Philips Electron Optics). The scanning electron microscope (SEM) is a sophisticated high-vacuum electron-optical instrument. The instrument is essential in performing failure analyses in support of many NASA/Johnson Space Center offices and programs. The instrument has also become the primary means this Center has of performing chemical analyses of materials. Maintaining the SEM in proper working order is an essential element of this Center's responsibility. The complexity of the instrument is such that the only practical means of keeping the instrument in proper working order is through a service contract. The subjec SEM is a Philips XL40 FEG instrument that was built by Philips and has been serviced by Philips since the purchase of this microscope in 1995. The service contract will continue the warranty (through FEI Company) of a great many of the instrument's components and will represent a significant savings to JSC if any of the warranted components have to be replaced. Proper maintenance and rapid troubleshooting require a familiarity with the characteristics of the subject instrument. Troubleshooting often requires comparing voltages and waveforms of a working instrument with a malfunctioning instrument or actual exchange of modules and components. Only FEI has the responsibility, and an established organization, for providing such servicing of this instrument. This organization includes training service engineers, spare parts inventory, maintenance manuals, access to other working instruments, and years of experience with the instrument. In accordance with FAR 6.302.1 and U.S.C. 2304(c)(1), a Justification for Other than Full and Open Competition stating a unique source is being prepared. The Government intends to acquire a commercial item using FAR Part 12. Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 4:30 p.m. local time on April 6, 2001. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice is solely within the discretion of the government. Oral communications are not acceptable in response to this notice. All responsible sources may submit an offer which shall be considered by the agency. An Ombudsman has been appointed. See NASA Specific Note "B". Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html

Web Link

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Record

Loren Data Corp. 20010330/JSOL004.HTM (D-087 SN50H5I9)