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COMMERCE BUSINESS DAILY ISSUE OF JULY 9,1999 PSA#2384U.S. Environmental Protection Agency, 26 W. Martin Luther King Dr.,
Cincinnati, OH 45268 52 -- ENERGY DISPERSIVE X-RAY MICROANALYSIS SYSTEM SOL ADA-001 DUE
072199 POC Barbara Curtiss at 513-487-2036 or fax number 513-487-2109
E-MAIL: BARBARA CURTISS, CINCINNATI CONTRACTS MANAGEMENT DIVISION,
curtiss.barbara@epa.mail.epa.gov. The U.S. Environmental Protection
Agency, the Subsurface Protection and Remedial Division of the National
Risk Management Research Laboratory located in ADA, Oklahoma, requires
an energy dispersive X-Ray Microanalysis System to be used in
conjuction with a scanning electron microscope (SEM) for the
quantitative analysis of elements in those solid matrices of interest
in environmental research. The instrument requires a high resolution
Germanium dector for characteristic X-Rays, and the ability to
interface with the present Jeol Model 5300 SEM system. The items being
requested are as follows: one each (1) Germanium Dector to fit Joel
5300 SEM, one each (1) microanalysis System and installation. This is
not a Small Business Set-Aside. This award if for full and open
competition and will be awarded made using the Simplified Acquisition
procedures under Far Part 13. A request for Quotation (RFQ) is expected
to be issued on or about July 22, 1999. All request for quotation must
be submitted by fax or mail to this office NLT Jul 21, 1999. All
request for quotation, must be in writing. NO TELEPHONE REQUEST WILL BE
HONORED. Award is expected on or about July 27, 1999. All responsible
sources may submit their written request to Barbara Curtiss at 26 W.
Martin Luther King Drive, or by fax number 513-487-2109.The U.S.
Environmental Protection Agency, the Subsurface Protection and Remedial
Division of the National Risk Management Research Laboratory located in
ADA, Oklahoma, requires an energy dispersive X-Ray Microanalysis System
to be used in conjuction with a Scanning Electronic Microscope (SEM)for
the quantitative analysis of elements in those solid matrices of
interest in environmental research. The instrument requires a high
resolution Germanium dector for characteristic X-Rays, and the ability
to interface with the present Jeol Model 5300 SEM system. The items
being requested are as follows: one each (1) Germanium Dector to fit
Jeol 5300 SEM, one each (1) microanalysis System and installation. This
is not a Small Business Set-Aside. This award if for full and open
competiton and will be awarded made using the Simplified Acquisition
procedures under Far Part 13. A request for Quotation (RFQ) is expected
to be issued on or about July 22, 1999. All request for quotation must
be submitted by fax or mail to this office NLT Jul 21, 1999. All
request for quotation, must be in writing. NO TELEPHONE REQUEST WILL BE
HONORED. Award is expected on or about July 27, 1999. All responsible
sources may submit their written request to Barbara Curtiss at 26 W.
Martin Luther King Drive, or by fax number 513-487-2109. Posted
07/07/99 (W-SN351261). (0188) Loren Data Corp. http://www.ld.com (SYN# 0285 19990709\52-0001.SOL)
52 - Measuring Tools Index Page
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