NASA/George C. Marshall Space Flight Center, Procurement Office, Marshall Space Flight Center, AL 35812

66 -- AUTOPROBE CP MICROSCOPE SOL 8-1-8-EH-B9218 DUE 061698 POC Marianne R. Campbell, Contract Specialist, Phone (256) 544-6496, Fax (256) 544-9081, Email marianne.campbell@msfc.nasa.gov -- Valerie N. Holmes, Contracting Officer, Phone (256)544-0314, Fax (256)544-4400, Email valerie.holmes@msfc.nasa.gov WEB: Click here for the latest information about this notice, http://nais.nasa.gov/EPS/MSFC/date.html#8-1-8-EH-B9218. E-MAIL: Marianne R. Campbell, marianne.campbell@msfc.nasa.gov. THIS NOTICE CONSTITUTES AMENDMENT NO. 2 TO THE COMBINED SYNOPSIS/RFQ FOR Autoprobe CP Microscope. Companies shall acknowledge all amendment(s) in their quote. This notice serves as the official amendment to subject synopsis/RFQ and a written amendment will not be issued. The purpose of this amendment is to answer the following questions received from a potential bidder and extend the response date to June 16, 1998. Question 1: In specification #1: Please provide further clarification to the requirement that " The SPM shall have multiple mode of operations with minimal effort necessary to change between imaging modes and that there is no probe head changes necessary". Specifically, we are looking for clarification on the requirement for "no probe head changes". Answer: By "no probe head changes", we are referring to a system that must be able to switch its operating modes without the exchange of any probe heads. A single probe head must feature the ability to switch from operation in contact AFM, non-contact AFM, intermittent-contact AFM, LFM, MFM, and STM with either a simple switch on the probe head, and/or a software command. While it is noted that some additional hardwares may be required by some of the ancillary techniques (Force Modulation, Phase Detection, Electrostatic force etc.), all imaging modes must be performed via one probe head. Question 2: In specification #6: Please provide further clarification on the requirement that the Force Modulation must be able to differentiate materials by hardness, and that Phase Microscopy must be able to detect variations in the physical properties of the sample surface. Specifically, we are looking for detailed clarification, in the form of a listing of specific materials and sample surfaces that you wish to be able to differentiate, and detect variations in, by Force and Phase operation. Answer: Our lab is concerned primarily with the development of new materials for a variety of applications. Force modulation and phase will be used to study such materials asmetal coatings, lubrication films, alloys, surface contaminants, and metal composites. These techniques will also be used for defect review and to study grain boundaries. The ability to glean mechanical information about the surfaces of these samples would be beneficial to our research. Specifically, we would like to use force modulation to detect variations in surface properties such as compliance or hardness. Preferably, we would like the system to utilize both a sample modulation and a tip modulation technique for force modulation and phase detection to accommodate different samples and imaging conditions. By phase detection, we wish to study variations in the visco-elastic properties of the sample surface. This is performed by detecting variations in the phase lag between the periodic signal that drives the sample or the cantilever to oscillate, and the detected cantilever response signal. Additionally, the system should allow phase detection to be performed in true non-contact operation to accommodate difficult samples. Question 3: Please provide further clarification on the requirement that "... Our research will require that we be able to use this new instrumentation interchangeably with our current instrumentation form Park Scientific Instruments". Specifically, we are looking for detailed clarification on the reasons the research requires interchange with the current Park Scientific Insturments, in order that we may provide a reply to this requirement. Answer: Because our facility deals with many different types of materials, we require the most open ended SPM solution available. The best SPM for our needs will allow us to perform sample analysis in both ambient conditions and in the ultra-high vacuum (UHV) environment. We need to be able to correlate the data taken under both conditions. As such, the ambient system must be able to interface directly with our UHV system to eliminate all variables except for those associated with the imaging environment. Therefore, the system we seek to procure is one which offers the ability to first, directly interface with our current PSI instrumentation, and second, one which enhances the performance of our current PSI instrumentation. Our requirements for such interface capabilities are based upon the following justifications: 1) A new system with 20-bit DAC control electronics that are able to interface with the head of our PSI UHV system will enhance the performance of this system by giving greater dynamic range than the current 16-bit electronics. For instance, with the CP MultiTask system, the UHV head can be hooked up to the CP Electronics, thus greatly enhancing the performance of our UHV instrument. 2) A new system which interfaces with our existing PSI system will provide and easy means for customized experimentation now and in the future. For example, an ambient system that is compatible with our existing UHV system will benefit from the ability to utilize piezo-resistive self-sensing cantilever technology. 3) A uniform data archiving format across both the newsystem and our existing PSI system will ensure reliable, rapid file exchange and data analysis between both systems. The due date for receipt of offers is extended to June 16, 1998. Companies shall provide the information stated in the synopsis/RFQ posted on the NASA Acquisition Internet Service (NAIS) on June 16, 1998. Documents related to this procurement are available over the Internet and are in Microsoft Office Suite (Word 6.0, Excel 5.0, or PowerPoint 4.0) format and reside on the World Wide Web (WWW) server which may be accessed using a WWW browser application. The WWW address or URL of the NASA/MSFC Business Opportunities home page is http://procurement.nasa.gov/EPS/MSFC/class.html. (0161)

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