Naval Research Laboratory, 4555 Overlook Ave., S.W., Washington, D.C. 20375-5326

66 -- SCANNING ELECTROSCOPE MICROSCOPE SYSTEM SOL N00014-97-R-HA02 POC Hilda R. Abdon, Contract Specialist, Code 3220.HA, Contracting Officer, Kevin M. King, (202) 767-2550. The Naval Research Laboratory (NRL) has a requirement for a Scanning Electron Microscope(SEM). It must be equipped with Electron Backscattered Pattern/Orientation Imaging Microscopy (EBSP/OIM) attachment and Energy Dispersive x-ray Spectroscopy System (EDS). The resolution specifications must be demonstrated after installation at the NRL site using standard resolution samples and must be achievable with all accessories installed on the column, including the X-ray detector. The SEM must be equipped with a field emission gun. The EBSP/OIM system components shall include: a) a silicon intensified target camera system with image processor, b) a forward scatter detector, c) SEM interface, d) software for acquisition, indexing, display, and storage of crystallographic data, and e) video monitor. The EDS System components shall include: a) a Si-Li x-ray detector, b) digital pulse- processing electronics, c) multichannel analyzer, and d) computer and software for data acquisition, storage, and quantitative composition analysis. Additional requirements will be provided in the solicitation. No telephone requests for this requirement will be accepted. Send request for Solicitation N00014-97-R-HA02 to CONTRACTING OFFICER, NAVAL RESEARCH LABORATORY, Attn: 3220.HA, 4555 Overlook Avenue, S.W., Washington, DC 20375-5326 or by forwarding a Request to: SYNOPSIS@CONTRACTS.NRL.NAVY.MIL. Facsimile requests may be forwarded to: FAX (202) 767-5896 or (202) 767-6197. NRL Ref. No. HA02. (0008)

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