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COMMERCE BUSINESS DAILY ISSUE OF JUNE 21,1996 PSA#1621FBI/TCAU, 14800 Conference Center Drive, Suite 300, Chantilly, VA
22021 66 -- INSTRUMENTS AND LABORATORY EQUIPMENT POC Charlene Galanty,
Contract Specialist, (703) 814-4906. The Federal Bureau of
Investigation (FBI) intends to negotiate on a sole basis with Amray who
is the U.S. distributor for the Atomika's Extra IIA-Multi Element Trace
Analyzer System with cooling system with heat exchange. This will be a
one-time purchase and will include a one year warranty which covers
installation, standard parts, emergency and routine service (excluding
x-ray tubes, which are warranted for 2,000 hours, prorata.) Operator
training is provided upon installation. The requirement is for a
commercially available, nondevelopmental, multi elemental analyzer
utilizing total reflection x-ray fluorescence (TXRF) technology. The
instrument provided must be capable of analysis of microgram sized
samples of forensic interest. The TXRF instrument will be used for
research concerning characterization of fiber, glass fragments,
toxicological samples such as hair, blood, and tissues, metal
transfers, paint chips, particles of forensic interest, such as gunshot
primers and particles generated by detonation of explosive devices, and
enviromental samples. The vendor shall supply the FBI Laboratory with
a TXRF system with the following analytical capabilities. These
capabilities must be demonstrated by the unit delivered following
installation in the FBI Laboratory: (1) provide both qualitative
spectral scans and full quantitative determinations of the maximum
range of elements possible by TXRF, (2) store profiles of elements to
be analyzed and calibration factors in the system once with
recalibration required no more frequently than semiannually, (3) have
detection limits (3 sigma) in the picogram range for representative,
interference free elements across the analyzed mass range, (4) provide
precision of better than 5% rsd for repeated measurements of
interference-free elements present at nanogram levels in a simple
(aqueous) matrix. A system providing these capabilities will typically
consist of the following components: (1) X-ray generator with an
output suitable for driving two 2 kW x-ray tubes (3.5kW). Control and
operation with two x-ray tubes must be suitable to provide the
stability required for a high precision analytical instrument. Control
x-ray generation parameters and safety interlocks must be controllable
from a microprocessor console, (2) molybdenum and tungsten micro focus
x-ray tubes, each with 2 kW max power with separate tube housings with
filter holder and shutter. Components 1 and 2 may be replaced with
another configuration involving a single x-ray tube of appropriate
wattage and secondary targets or filters to provide the appropriate
wavelength control of sourve x-rays (3) total reflection unit suitable
for TXRF signal acquisition. X-rays impinging upon the sample surface
must meet the energy and geometric requirements of TXRI, i.e.,
incident at less than 0.50 from the sample surface, (4) Si(Li) detector
with 80 mm2 surface area and energy resolution better thatn 168 at 5
keV, (5) analysis system consisting of a multichannel analyzer with
detector electronics and a PC (minimum 4 MB RAM, 80486 66 MHZ
processor, 520 MB hard disk, 1.2 MB floppy drive, 1.4 MB floppy VGA
video adapter plus monitor, and I/O board and RS 232 and centronics),
and black and white printer, (6) sample carrier with capability for
multiple samples, programmable sequencing, with single and multiple
measurement capability on each sample. Holder must be capable of
holding solid samples and evaporated solutions, (7) software for
operation of the sustem including programs for system control, data
acquisition, data reduction, quantitative analysis, preparation of
reports and graphical representation of spectra, and (8) manufacturers
warranty to include installation, standard parts, emergency and
routine service, operating training upon installation, support include
free upgrades of all software, and telephonic applications support.
Vendors able to meet this requirement are invited to identify their
interest and capability by submitting a company brochure and pricing
documentation within forty-five (45) days of this publication. If no
affirmative responses are received within this time that clearly
establishes a comparable source more advantageous to the
government,negotiations will take place with Amray on a sole-source
basis. All inquiries shall be in writing to the above address and
marked to the attention of Charlene Galanty, Contract Specialist. No
telephone inquires or requests for documents will be accepted. See
numbered note: 22 (0171) Loren Data Corp. http://www.ld.com (SYN# 0317 19960620\66-0001.SOL)
66 - Instruments and Laboratory Equipment Index Page
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