66 - Instruments and Laboratory Equipment

AWARDS

• ONE LOT EACH CALIBRATION EQUIPMENT, SPARE PARTS,
• WEAPONS TELEMETRY GROUND TEST SET
• MIRROR OPTIC SYSTEM AND 2-THETA STAGE
• IMAGE ANALYSIS SYSTEM UPGRADE
• THERMAL SHOCK TEST CHAMBER
• ALTITUDE TEST CHAMBER
• RELAY TEST SETS
• INDICATOR ASSEMBLY
• VACUUM INFILTRATION TISSUE PROCESSOR
• INDUCTIVELY COUPLED PLASMA-MASS SPECTROMETER (ICP/MS)
• AUTOMATIC CABLE ANALYZER SYSTEM
• PORTABLE X-RAY FLUORESCENCE SPECTROMETER AND
• WASTE CURIE MONITOR
• LABORATORY AUTOCLAVE (1) FOR THE U.S. DEPARTMENT OF
• SCANNING ELECTRON MICROSCOPE (SEM) WITH ENERGY
• RECORDER SUBASSEMB
• UP GRADE TWO (2) PROTOTYPE SENSORS AND ONE (1)
• AWARD OF AUTOMATED SAMPLE OXIDIZER
• CONTACT-CORE ASSY, ROTOR; P/N 7882705-011; 69 EA --
• CONTACT AND CORE ASSY/C135; P/N 7882721-011; 83 EA --
• CONTROL DISPLAY UNIT; P/N 560-0000-004; 8 EA --
• CRYOGENIC MICROWAVE PROBE STATION
• INDICATOR
• FT-IR/RAMAN SPECTROMETER
• PLANT GROWTH CHAMBER
• RATIO ISOTOPE MASS SPECTROMETER
• HUNTRON TESTING SYSTEM
• AUTOMATIC THERMOLUMINESCENT DOSIMETRY SYSTEM
• SPARE PARTS
• CENTRIFUGE, LABORATORY, 115 VOLT, 50-60
• CONTINUOUS EMISSION MONITORING PANEL
• FIVE AXIS FLIGHT MOTION SIMULATOR
• DETECTOR; P/N 11239-1; 16 EA --6685011480471TP
• ELECTRICAL EQUIP N.E.C. --6660NCB007022
• ALIBRATION MONITORS FOR THE AN/FMQ-8 --6660ND600865F
• N/A
• ELECTRON MICROSCOPE