National Institute of Standards and Technology, Acquisition and Assistance Division, Building 30l, Room Bll7, Gaithersburg, MD 20899

66 -- FIELD-EMISSION SCANNING ELECTRON MICROSCOPE SYSTEM SOL 52SBNB5C8751 DUE 070595 POC Kathleen Lettofsky (301) 975-6342 This action originally publicized in the CBD dated May 24, 1995, is corrected to include an initial warranty year and an additional warranty year for the Field-Emission Scanning Electron Microscope System and option to purchase the x-ray detector system. All other information publicized in the original synopsis is correct. (0174)

Loren Data Corp. http://www.ld.com (SYN# 0431 19950626\66-0011.SOL)