National Institute of Standards and Technology, Acquisition and Assistance Division, Bldg. 301, Room B117, Gaithersburg, MD 20899

66 -- OBSERVER SCANNING PROBE MICROSCOPE ACCESSORY SOL 52SBNB5C8724 DUE 052795 POC David L. Merrell (301) 975-6308, Pauline Mallgrave Contracting Officer (301) 975-6330 The National Institute of Standards & Technology has a requirement for a new or used SCANNED PROBE SYSTEM (SPM) to be utilized in the Government owned high-vacuum specimen chamber of the Hitachi S-4000 high resolution scanning microscope. Supplier shall provide installation, training, and minimum 12 month warranty. Delivery required 60 calendar days after award -- FOB Destination - Gaithersburg, MD. All responsible sources may submit a proposal which shall be considered by the agency. Request for copies of the solicitation should be in writing. (0101)

Loren Data Corp. http://www.ld.com (SYN# 0405 19950412\66-0020.SOL)