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SAMDAILY.US - ISSUE OF SEPTEMBER 10, 2026 SAM #9054
SOLICITATION NOTICE

66 -- 3D Imaging Microscope System

Notice Date
9/8/2026 12:00:00 AM
 
Notice Type
Combined Synopsis/Solicitation
 
NAICS
334519 — Other Measuring and Controlling Device Manufacturing
 
Contracting Office
FDA OFFICE OF ACQ GRANT SVCS Rockville MD 20852 USA
 
ZIP Code
20852
 
Solicitation Number
75F40126Q00383
 
Response Due
9/14/2026 12:00:00 AM
 
Archive Date
09/29/2026
 
Point of Contact
Pamela T. Lee, Phone: 2404023847, Madeline Bryant, Phone: 2404027611
 
E-Mail Address
pamela.lee@fda.hhs.gov, madeline.bryant@fda.hhs.gov
(pamela.lee@fda.hhs.gov, madeline.bryant@fda.hhs.gov)
 
Small Business Set-Aside
NONE No Set aside used
 
Description
SCOPE I. Minimum Performance Requirements/Salient Characteristics Salient Characteristics The contractor shall provide all resources necessary to accomplish the tasks and deliverables described in this statement of work, including the hardware system requirements which are the minimum requirements. Equivalent requirements that differ from these minimum requirements must be justified by the proposing vendor and evaluated by the NFCC prior to purchase. 1.0 General Requirement The National Forensic Chemistry Center (NFCC) requires a Bruker Alicona InfiniteFocus G6 (IFM G6) optical 3D measurement system. This non-contact, optical 3D imaging and measurement system will be used by NFCC's Trace Examination Section (TES) for surface profilometry and difference analysis measurements, including tablet debossing, punch face embossing, surface abrasion, pit measurements, corroded surface analysis, and pharmaceutical packaging topography and print profiling. The system must expand analytical throughput to meet increasing demand for forensic 3D image analysis from law enforcement stakeholders. 2.0 Core Technology and Measurement Principle 2.1 The system shall be based on the principle of Focus Variation Microscopy (FVM), utilizing Bruker Alicona's proprietary Focus Variation algorithms to reconstruct high-resolution 3D surfaces. 2.2 The system must include advanced illumination technology (e.g., ring light, coaxial light) to enable accurate measurement of surfaces with steep angles, up to and exceeding 85 degrees. 2.3 The system must be capable of measuring both form and surface roughness parameters in a single measurement, with all data being co-registered. 2.4 The system must have the ability to measure highly reflective materials without surface treatment. The system must be capable of acquiring accurate 3D topographic data on reflective and specular materials without requiring surface alteration that could compromise the integrity of forensic samples. 2.5 The system must have the capability to capture true-color optical data co-registered with 3D topography. This capability supports surface characterization, documentation, and interpretation of coating or material variations. Many profilometry systems such as systems that use laser or tip technologies do not provide integrated true-color 3D datasets.
 
Web Link
SAM.gov Permalink
(https://sam.gov/workspace/contract/opp/44430997898d4b699da81c4f883899c2/view)
 
Place of Performance
Address: Cincinnati, OH 45237, USA
Zip Code: 45237
Country: USA
 
Record
SN07961388-F 20260910/260908230050 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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