SAMDaily.us | SNOTE | 66 | Micro x-ray source for defect detection in metallic AM structures.

SAMDAILY.US - ISSUE OF AUGUST 28, 2026 SAM #9041
SPECIAL NOTICE

66 -- Micro x-ray source for defect detection in metallic AM structures.

Notice Date: 8/26/2026 12:00:00 AM
Notice Type: Special Notice
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: NATIONAL AERONAUTICS AND SPACE ADMINISTRATION US
ZIP Code: 00000
Solicitation Number: 80NSSC26942207Q
Response Due: 8/28/2026 2:00:00 PM
Archive Date: 09/12/2026
Point of Contact: Lindsey McLellan, Bobbie Young
E-Mail Address: lindsey.m.mclellan@nasa.gov, bobbie.j.young@nasa.gov
(lindsey.m.mclellan@nasa.gov, bobbie.j.young@nasa.gov)
Small Business Set-Aside: NONE No Set aside used
Description: NASA/NSSC has a requirement for Micro x-ray source for defect detection in metallic AM structures. See the attached SOW and request for capability statements. All correspondence must reference the notice ID in the subject line for reference. NOTE: Quotes received in response to this notice will NOT be considered and will not be evaluated by NASA�s Technical End User Team. We are currently only requesting Capability Statements.
Web Link: SAM.gov Permalink
(https://sam.gov/workspace/contract/opp/bf3f2684fab2457faef21ce387874afd/view)
Place of Performance: Address: Hampton, VA 23681, USA; Zip Code: 23681; Country: USA
Record: SN07944030-F 20260828/260826230043 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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