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SAMDAILY.US - ISSUE OF MARCH 14, 2025 SAM #8509
SPECIAL NOTICE

59 -- NOTICE OF INTENT TO SOLE SOURCE for Extreme Thermal Cycling Chamber

Notice Date
3/12/2025 12:47:27 PM
 
Notice Type
Special Notice
 
NAICS
334413 — Semiconductor and Related Device Manufacturing
 
Contracting Office
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY US
 
ZIP Code
00000
 
Solicitation Number
ACQ0042339
 
Response Due
3/23/2025 1:00:00 PM
 
Archive Date
04/07/2025
 
Point of Contact
Nina Lin, Forest Crumpler
 
E-Mail Address
nina.lin@nist.gov, forest.crumpler@nist.gov
(nina.lin@nist.gov, forest.crumpler@nist.gov)
 
Description
Notice of Intent to Noncompetitively acquire an extreme thermal cycling chamber This notice is not a request for a quotation. A solicitation document will not be issued, and quotations will not be requested. This acquisition is being conducted under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334413, Semiconductor Devices and Associated Hardware which has a small business size standard of 1,250 employees. The National Institute of Standards and Technology (NIST) Infrastructure and Materials Group within Engineering Laboratory (EL) is seeking an extreme thermal cycling chamber to perform accelerated aging experiments as part of a study of long-term reliability of materials used in advanced packaging of semiconductor chips. This work is in support of the CHIPS Metrology program. In support of the CHIPS Metrology program, reliability testing and modeling of polymeric components in advanced packaging for semiconductors will be studied and developed. These materials will include underfill epoxies, thermal interface materials, and redistribution layer components. Extensive material property characterization of these components and their interfacial properties during environmental exposure (e.g., temperature, humidity, thermal cycling) will be completed for accurate reliability modeling development. Inverse gas chromatography will be used to measure shifts in work of adhesion throughout the aging process as part of this work. The work of adhesion of films (and particulates as needed) will be measured on samples throughout the aging process. These properties will also be measured in samples under variable temperature and relative humidity to investigate the effects of these environmental factors on work of adhesion throughout the aging process. The CHIPS Metrology program develops and advances cutting edge metrology capabilities for members of the US semiconductor manufacturing ecosystem. This NIST conducted research program works with device manufacturers, tool vendors, materials suppliers, and other organizations to address critical metrology gaps to spur innovation within seven grand challenge areas. For more information on CHIPS Metrology, please visit https://www.nist.gov/chips/research-development-programs/metrology-program NIST conducted market research from Feburary to March 2025 to determine what sources could potentially meet NIST�s minimum requirements for an extreme thermal cycling chamber. This included searches on GSA; SAM; Thomas Register; surveying vendor websites; and issuance of a Sources Sought Notice on SAM.gov. Market research identified a few manufacturers of extreme thermal cycling chambers, but only one has an available extreme thermal cycling chamber that provides rapid enough thermal cycling (70C/min) within the required temperature range (minimum temperature of -100 �C or lower to maximum temperature of 200 �C or higher). Other available systems do not provide the required thermal ramp rates. The results of market research revealed that only ESPEC North America Inc (UEI: N61JEZXYKXN5) appears to be capable of meeting NIST�s requirements. However, any sources that believe they are capable of meeting NIST�s minimum requirements are encouraged to respond to this notice by the response date to provide the following information at a minimum: Company Unique Entity Identifier (UEI) number in https://sam.gov; details about what your company is capable of providing that meets or exceeds NIST�s minimum requirements; whether your company is an authorized reseller of the product or service being cited and evidence of such authorization; and any other information that can help NIST determine whether this requirement may be competitively satisfied. A determination by the Government not to compete the proposed acquisition based upon responses to this notice is solely within the discretion of the Government. Information received will be considered solely for the purpose of determining whether to conduct a competitive procurement. Only responses received by the offers due date and time of this notice will be considered by the government. Responses shall be submitted via email to nina.lin@nist.gov.
 
Web Link
SAM.gov Permalink
(https://sam.gov/opp/6afad05fded6479e843d0233610deb10/view)
 
Place of Performance
Address: Gaithersburg, MD 20899, USA
Zip Code: 20899
Country: USA
 
Record
SN07369078-F 20250314/250312230039 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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