SAMDaily.us | SRCSGT | 66 | Scanning Electron Microscope for X-ray Tomography

SAMDAILY.US - ISSUE OF MARCH 06, 2024 SAM #8135
SOURCES SOUGHT

66 -- Scanning Electron Microscope for X-ray Tomography

Notice Date: 3/4/2024 8:28:37 AM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: NIST-SS24-CHIPS-0026
Response Due: 3/18/2024 8:00:00 AM
Archive Date: 04/02/2024
Point of Contact: Brandon Butler, Tracy Retterer
E-Mail Address: brandon.butler@nist.gov, Tracy.retterer@nist.gov
(brandon.butler@nist.gov, Tracy.retterer@nist.gov)
Description: NIST is seeking information from sources that may be capable of providing a solution that meets or exceeds the following draft minimum specifications and evaluation criteria. The required item is a scanning electron microscope (SEM), which will be used as part of a novel x-ray tomography instrument. Please see attached noticed for details.�
Web Link: SAM.gov Permalink
(https://sam.gov/opp/8af8ceb405ac406782e757729bb0c1dc/view)
Place of Performance: Address: Boulder, CO 80305, USA; Zip Code: 80305; Country: USA
Record: SN06985203-F 20240306/240304230049 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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