SAMDaily.us | SRCSGT | 66 | Fluid immersion AFM for use with optomechanical probes.

SAMDAILY.US - ISSUE OF FEBRUARY 17, 2024 SAM #8117
SOURCES SOUGHT

66 -- Fluid immersion AFM for use with optomechanical probes.

Notice Date: 2/15/2024 11:52:52 AM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: NIST-SS24-CHIPS-0015
Response Due: 2/29/2024 8:00:00 AM
Archive Date: 03/15/2024
Point of Contact: Brandon Butler, Tracy Retterer
E-Mail Address: brandon.butler@nist.gov, Tracy.retterer@nist.gov
(brandon.butler@nist.gov, Tracy.retterer@nist.gov)
Description: The National Institute of Standards and Technology (NIST) CHIPS metrology program has a requirement for a customized fluid immersion atomic force microscope (AFM) to develop advanced in-situ measurement methods of physical-chemical processes at the solid-liquid interfaces with relevance to semiconductor manufacturing. See attached Sources Sought Notification.
Web Link: SAM.gov Permalink
(https://sam.gov/opp/e2345faf4e9d4abeb78668845b4ba713/view)
Place of Performance: Address: Gaithersburg, MD, USA; Country: USA
Record: SN06968374-F 20240217/240215230100 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

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