SAMDaily.us | SRCSGT | 66 | Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD

SAMDAILY.US - ISSUE OF JANUARY 10, 2024 SAM #8079
SOURCES SOUGHT

66 -- Scanning Electron Microscope (SEM) Analytical Detectors including Direct Electron EBSD

Notice Date: 1/8/2024 2:40:07 PM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: NIST-SS24-CHIPS-0002
Response Due: 1/23/2024 8:00:00 AM
Archive Date: 02/07/2024
Point of Contact: Jenna Bortner, Tracy Retterer
E-Mail Address: jenna.bortner@nist.gov, Tracy.retterer@nist.gov
(jenna.bortner@nist.gov, Tracy.retterer@nist.gov)
Description: Please See Attachment.
Web Link: SAM.gov Permalink
(https://sam.gov/opp/6214322b47944a5699c074c653852d6e/view)
Place of Performance: Address: Gaithersburg, MD 20899, USA; Zip Code: 20899; Country: USA
Record: SN06930159-F 20240110/240108230048 (samdaily.us)
Source: SAM.gov Link to This Notice
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