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SAMDAILY.US - ISSUE OF JULY 29, 2023 SAM #7914
SPECIAL NOTICE

70 -- General Information

Notice Date
7/27/2023 11:27:48 AM
 
Notice Type
Special Notice
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
NASA IT PROCUREMENT OFFICE Greenbelt MD 20771 USA
 
ZIP Code
20771
 
Solicitation Number
80TECH23Q0033
 
Response Due
8/11/2023 7:45:00 AM
 
Archive Date
08/11/2023
 
Point of Contact
Dennis A. Ross
 
E-Mail Address
Dennis.a.ross@nasa.gov
(Dennis.a.ross@nasa.gov)
 
Description
STATEMENT OF WORK 1. Objective/Requirements Marshall Space Flight Center (MSFC) requires the purchase of Oxford Instruments high-resolution,� high-speed electron backscatter diffraction (EBSD) detector and an Oxford Instruments live x-ray� imaging energy dispersive spectroscopy detector (EDS) for faster diagnostic and explorative� analysis. Requirements also include a computer, the required software to operate and process the� data generated by these detectors, as well as installation and training. 2. Characteristics, Scope, and Specs Quantity Part # Description 1 � �51N1141 AZtecLive Standard Microanalysis System with Ultim Max 170 large area Analytical Silicon Drift� Detector This comprehensive energy-dispersive X-ray Microanalysis system Includes the new 'AZtecLive' step,� which enables the quick and comprehensive investigation of a sample with real-time chemical� feedback plus all the tools required to perform qualitative and quantitative analysis, image� capture image-centric analysis, and X-ray spectral mapping and line scanning. Software includes: - Live X-ray Maps - Live Trace - Tru-Q analysis engine - Point and ID - AutoID - Standardless quantitative analysis - Spectral imaging - AutoLayer element and phase visualization -AZtecTruMap - Microsoft Office for report generation - Additional license for off-line processing Hardware includes: - Ultim Max 170 - 170mm2 sensor size. - Resolution guaranteed on Mn K - 127eV at 130,000 cps. - Includes SATW window for detection of elements from Beryllium - X4 Pulse Processor and Imaging Electronics - An Ethernet-based Module that provides X, Y scan� generation and X-ray acquisition and detection - Windows 10 PC - 27-inch Widescreen LCD display 1 � �51N2052 Integrated AZtecHKL system Expert with Symmetry S3 Integrated AZtecHKL is a powerful platform for EBSD that can be combined with AZtecEnergy for both� independent and simultaneous EDS and EBSD analysis. Simultaneous data collection can be used in Phase Identification where the X-ray data is used to� identify candidate phases and the EBSD data used to distinguish the phases. EBSD and EDS data can� also be collected simultaneously as maps, enabling a true characterization of the sample. Includes all the tools necessary to collect and solve EBSD patterns including: - Autocal, Auto Exposure, Auto Background, Detector Control, Calibration Refinement Tools, Tru-I� Indexing and Solver engines, ICSD database, Large Area Mapping, MapQueue, Image Registration,� AutoLock Drift Correction, TruPhase, Color FSD Imaging, Psuedosymmetry Correction, CIF Import, HKL� Steel, AZtecCrystal Advanced, AZtecCrystal MapSweeper, Crystal Definitions, Advanced Textures,� Materials Properties, Calssify Tool, Parent Grain Analysis, Dislocation Analysis Hardware: - Symmetry EBSD detector - Forward scatter detector with 5 diodes - EBSD Control Box and Hand Set - Symmetry Windows 10 PC - 27 inch Widescreen LCD display 1 � �51A1019 �AZtec Magnetic Field Correction (for SEMs with semi-in or immersion lens). 1 � �51A4001 �Geological Phase Database - Am. Min. 1 � �51A4002 �NIST Structural Database (NSD) 1 � �INSEGR AZtecLive installation and software familiarization. Includes one credit towards tuition to EDS training school at an Oxford Instruments America, Inc.� training facility. The credit must be used within 12 months of installation. For additional tuition� credits, see part number Z006. WARRANTY: All systems and equipment sold by Oxford Instruments� America, Inc. is supplied with a complete 12-month part and labor warranty. 1 � �INSHKL HKL EBSD installation and software familiarization. Includes one credit towards tuition to EBSD training school at an Oxford Instruments America, Inc.� training facility. The credit must be used within 12 months of installation. For additional tuition� credits, see part number Z006. WARRANTY: All systems and equipment sold by Oxford Instruments� America, Inc. is supplied with a complete 12-month part and labor warranty. 1 � Z003/2DA On-site Application Training - Two Days On-site applications training with an Oxford Instruments, Microanalysis applications specialist.� The on-site training cost is applicable for up to 6 users per session. Expenses are included. 3. Place of Performance Address for the shipping facility: 4631 Saturn Rd Bldg 4631, Huntsville, AL 35812 The final Place of Delivery is: NASA Marshall Space Flight Center Building 4602 room 1128 � 4. Period of Performance 14-16 Weeks from the effective order date of TBD. �
 
Web Link
SAM.gov Permalink
(https://sam.gov/opp/9fbfe2d5a8ce46ed9227cbfa431870db/view)
 
Place of Performance
Address: Huntsville, AL 35812, USA
Zip Code: 35812
Country: USA
 
Record
SN06765995-F 20230729/230727230043 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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