SOLICITATION NOTICE
66 -- High-Speed Pixel Array Detector
- Notice Date
- 7/13/2023 10:49:08 AM
- Notice Type
- Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- ARGONNE NATL LAB - DOE CONTRACTOR Lemont IL 60439 USA
- ZIP Code
- 60439
- Solicitation Number
- 3-B175-Q-00642-00
- Response Due
- 7/18/2023 10:00:00 AM
- Archive Date
- 07/18/2023
- Point of Contact
- Jenna Doria-Garner, Phone: 6302526988
- E-Mail Address
-
jdoria@anl.gov
(jdoria@anl.gov)
- Description
- Advances in x-ray brightness on storage ring and XFEL sources are driving the need for new detector technologies to operate at high count rates and high speeds. Three classes of pixel array detectors address these needs, photon counters, charge integrators, and a hybrid of counters and integrators. Photon counting detectors have dramatically impacted data collection at storage ring sources. The counters are noise-free, resulting in a huge dynamic range and thus minimizing radiation damage by eliminating the need for multiple passes to record strong and weak reflections. The high frame rates enable fine-phi slicing, which further enhances data quality. However, one must avoid excessive dead time losses as the count rate approaches the maximum rate. The high instantaneous x-ray rate� is driving the development of charge integrating detectors. These detectors can record extremely high instantaneous x-ray rates, but they suffer from dark currents that limit the dynamic range. The hybrid detectors combine the best of both techniques a counter for low rates and an integrator for high rates. On-board electronics handles switching between modes. However, to minimize the impact of the dark current at a storage ring source, one should collect data at the maximum frame rate, which may consume much more disk space than necessary. Our vision is to provide the highest resolution data achievable from challenging problems in structural biology that tend to yield tiny, weakly diffracting crystals. The highest resolution data recordable from a single crystal or the fewest number of partial data sets from multiple crystals is limited by crystal quality, radiation damage, detector read-out noise, and instrumental background. Critical Requirements High frame rate (~500 Hz) Low read-out dead-time (1�107) Small pixel dimensions (50-75 microns) At least 16 million pixels and a high quantum efficiency CdTe sensor Deliverables High-speed Pixel Array Detector Detector Control Unit Air-Cooled Chiller (115V) All Applicable Documentation Packing Set Detector Processing Unit If able to provide equipment that matches the requirements listed above please review, complete, and provide the following no later than 12:00 PM CST on 7/18/2023. Instructions for Bidders, dated 07/13/2023 (Review) Appendix ""A"" Argonne Terms and Conditions for Commercial Items and Services, ANL-71-COM, dated 02/13/2023 (Review and Accept) Low Risk Work by Contractors on the Argonne Site Supplemental Conditions, ANL-366L, dated 06/23/2023 (Review and Accept) Statement of Work, High-Speed High-Sensitivity Detector for X-ray Micro-Crystallography at GM/CA@APS, dated 07/12/2023 (Review) Pre-Award Information, PD-159, dated 06/06/2022 (Complete) ANL-70 Requestion for Proposal, dated 07/13/2023 (Complete) Proposal (Provide) Product Specifications�(Provide) Country of Origin of Equipement�(Provide) Price Justification - in the form of a published pricelist or redacted invoice to support quoted pricing (Provide) Certificate of Commercial Pricing (Complete)
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/a3ab1fc6eaa2479c8ad67909162562ac/view)
- Place of Performance
- Address: USA
- Country: USA
- Country: USA
- Record
- SN06748276-F 20230715/230713230059 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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