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SAMDAILY.US - ISSUE OF MAY 28, 2023 SAM #7852
SOURCES SOUGHT

66 -- Stroboscopic holographic microscope

Notice Date
5/26/2023 11:32:28 AM
 
Notice Type
Sources Sought
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
 
ZIP Code
20899
 
Solicitation Number
NB6811102302302
 
Response Due
6/8/2023 11:00:00 PM
 
Archive Date
06/24/2023
 
Point of Contact
Ian Robinson, Phone: 3014976126
 
E-Mail Address
ian.robinson@nist.gov
(ian.robinson@nist.gov)
 
Description
The National Institute of Standards & Technology (NIST) seeks information on vendors that can provide a commercial holographic microscope with stroboscopic vibration measurement capabilities. The microscope will be used to measure the motion of microelectromechanical systems at frequencies out to 25 MHz. PLEASE SEE ATTACHED SOURCES SOUGHT NOTICE FOR DETAILS AND SUBMISSION INSTRUCTIONS. Technical Specifications: The microscope must have the following functionalities: Must be capable of measuring the surface of a sample using digital holographic microscopy. Must be capable of using digital holographic microscopy to measure the topography of a sample. Must be capable of using stroboscopic digital holographic microscopy to measure the vibrations of a sample in all three degrees of freedom. Must be capable of measuring the topography and vibrations of a sample while it is located in a vacuum chamber. The microscope must include: the microscope head, a supporting bracket for mounting the microscope head, a supporting base, an XYZ manual motion stage for moving a sample under the microscope head, a vacuum chamber that mounts on top of the motion stage, a cooling/heating element in the vacuum chamber, a chamber temperature controller, an electrical frequency source for driving microelectromechanical actuators during measurement, a computer for controlling the microscope and analyzing data, and software for controlling the microscope and analyzing the data. The microscope head must be able to support at least 5 microscope objectives in a rotational turret. Software must be capable of generating topography and vibration maps of the sample, and frequency responses (amplitude and phase) for every measured location on the sample. The wavemeter must meet the following Minimum Specifications. ��Vertical topography accuracy: at least 0.15 nm Vertical topography measurement range: at least 200 micrometers Lateral measurement resolution: at least 300 nm with a specific microscope objective Image acquisition rate: at least 190 frames per second Camera pixel resolution: at least 1 megapixels Microscope objective magnifications provided: 5X, 10X, 20X, 40X Stroboscopic frequency range: at least 1 Hz to 25 MHz Minimum stroboscopic pulse length: 7.5 ns or shorter Frequency source amplitude resolution: 14 bits or better Frequency source voltage range: +/- 10 V or better Vibration amplitude measurement resolution: 50 pm or smaller XYZ manual motion stage range: at least 12 mm in all directions Vacuum chamber base pressure: 2.3 mtorr or lower Chamber temperature range: -40 C to 80 C or wider Chamber vacuum pump outlet: standard KF size Chamber electrical feedthroughs: at least 2 SMA connectors (4 SMA connectors is preferred), at least 8 DC voltage connectors Must be smaller than: 700 x 700 x 900 mm Must weigh less than: 60 kg
 
Web Link
SAM.gov Permalink
(https://sam.gov/opp/aec2292ea75144bcb65cc2773cac6ddc/view)
 
Place of Performance
Address: Gaithersburg, MD 20899, USA
Zip Code: 20899
Country: USA
 
Record
SN06696561-F 20230528/230526230110 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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