SOLICITATION NOTICE
66 -- Triple Quadrupole Mass Spectrometer
- Notice Date
- 3/6/2023 12:42:55 PM
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
- ZIP Code
- 20899
- Solicitation Number
- 1333ND23QNB640136
- Response Due
- 3/13/2023 10:00:00 AM
- Archive Date
- 03/28/2023
- Point of Contact
- Latish Walker, Phone: 3019750474
- E-Mail Address
-
latish.walker@nist.gov
(latish.walker@nist.gov)
- Description
- Amendement I� The purpose of this amendment is to change the delivery requirement in accordance with the attached amended statement of requirement. Submissions are due 3/13/2023.� All other terms and conditions remain unchanged, as a result of this order.� COMBINED SYNOPSIS/SOLICITATION 1333ND23QNB640136 Triple Quadrupole Mass Spectrometer This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR 12.6 � Streamlined Procedures for Evaluation and Solicitation for Commercial Items as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotations are being requested, and a separate written solicitation document will not be issued. This solicitation is being issued under the authority of FAR Part 13.5, Simplified Acquisition Procedures. This solicitation is a Request for Quotations (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2023-01, effective 12/30/2022. The associated North American Industrial Classification System (NAICS) code for this procurement is 334516 � Analytical Laboratory Instrument Manufacturing. The small business size standard is 1,000 employees. This acquisition will utilize 100% Small Business Set-Aside procedures. The National Institute of Standards and Technology�s (NIST) Surface and Trace Chemical Analysis Group (STCAG) develops, improves, and standardizes analytical technics used for the elemental, organic, isotopic, radiological, and morphological characterization of surfaces, thin films, and particles.
- Web Link
-
SAM.gov Permalink
(https://sam.gov/opp/dfd146145dd04b758e20819993540ba7/view)
- Record
- SN06609770-F 20230308/230306230107 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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