SAMDaily.us | SRCSGT | 66 | Suite of Analytical Detectors for Focused Ion Beam and Scanning Electron Microscopes

SAMDAILY.US - ISSUE OF FEBRUARY 08, 2023 SAM #7743
SOURCES SOUGHT

66 -- Suite of Analytical Detectors for Focused Ion Beam and Scanning Electron Microscopes

Notice Date: 2/6/2023 11:34:39 AM
Notice Type: Sources Sought
NAICS: 334516 — Analytical Laboratory Instrument Manufacturing
Contracting Office: DEPT OF COMMERCE NIST GAITHERSBURG MD 20899 USA
ZIP Code: 20899
Solicitation Number: NIST-SS23-CHIPS-0027
Response Due: 2/22/2023 8:00:00 AM
Point of Contact: Ian Robinson, Forest Crumpler
E-Mail Address: ian.robinson@nist.gov, forest.crumpler@nist.gov
(ian.robinson@nist.gov, forest.crumpler@nist.gov)
Description: This is a sources sought notice. Please see attachment NIST-SS23-CHIPS-0027 for complete notice details.
Web Link: SAM.gov Permalink
(https://sam.gov/opp/7652558159fd4b1f8b360c1b29560014/view)
Place of Performance: Address: Boulder, CO 80305, USA; Zip Code: 80305; Country: USA
Record: SN06583881-F 20230208/230206230115 (samdaily.us)
Source: SAM.gov Link to This Notice
(may not be valid after Archive Date)

| FSG Index | This Issue's Index | Today's SAM Daily Index Page |