SPECIAL NOTICE
66 -- Scanning and Transmission Electron Microscope (STEM)
- Notice Date
- 5/14/2021 10:24:47 AM
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- NASA JOHNSON SPACE CENTER HOUSTON TX 77058 USA
- ZIP Code
- 77058
- Solicitation Number
- 80JSC021STEM
- Response Due
- 5/21/2021 3:00:00 PM
- Archive Date
- 06/05/2021
- Point of Contact
- Amanda Graziosi, Chrystal D. Wiseman
- E-Mail Address
-
amanda.l.graziosi@nasa.gov, chrystal.d.wiseman@nasa.gov
(amanda.l.graziosi@nasa.gov, chrystal.d.wiseman@nasa.gov)
- Description
- This is modification 1� 1to the synopsis entitled Scanning and Transmission Electron Microscope (STEM) 80JSC021P0026 which was posted on May 5, 2021. You are notified that the following changes are made: This modification outlines the minimum requirements that must be met for the STEM contract. The specific requirements that must be met for the STEM contract are as follows: Electron Source The microscope shall utilize a cold field emission (CFEG) source. The minimum energy resolution shall be 0.3 eV or better, without the use of a monochromator, as measured by full width half maximum of the zero-loss peak in an EELS spectrum. The Vendor shall demonstrate commercially available TEM CFEG technology of considerable longevity (> 10 years), with existing toolsets exhibiting continued and reliable performance; the CFEG install base shall be >100, preferably >200. The Vendor shall provide an updated customer list of in-service CFEG TEMs. Aberration Corrector The microscope will utilize a higher/5th-order Cs aberration corrector for STEM imaging. The corrector alignment process shall be automated and require only a general/amorphous sample region; i.e., a standard alignment specimen shall not be required. Detector systems A detection chamber capable of accommodating the necessary STEM detectors and CCD cameras are required to simultaneously image up to 4 scanning signals, including bright field, low or medium angle annular dark field, high angle annular dark field and a secondary electron/backscattered electron (SE/BSE) detector. SE/BSE detector will be provided with a guaranteed secondary image resolution (SEI) of 1.0 nm at 200 kV.� An annular bright field (ABF) STEM imaging detector should be included along with the HAADF imaging detector. Image resolution specifications �STEM high-angle annular darkfield imaging resolution of 0.083 nm or better at 200 kV and 0.136 nm or better at 80 kV. Conventional TEM imaging lattice resolution of 0.14 nm or better at both 200 and 80 kV. Energy-dispersive X-ray (EDX) Spectrometer System The microscope EDX system shall include two large area (each 158 mm2 or greater) silicon drift detectors (SDD), positioned for efficient EDX tomography (offset 90� from each other), each with a high takeoff angle (> 30�) to minimize shadowing. The system shall have a large solid angle of 2.2 steradians or greater; this value will have been calculated with prior accounting for any detector shadowing, etc. i.e., it is the true, experimental value of the system. The system shall have a high peak-to-background ratio of 4000 or more, while maintaining minimal contribution from spurious peaks (0.5% or less). Electron-Energy-loss Spectroscopy (EELS) System The STEM instrument will include the addition of a Gatan Continuum K3 imaging filter system with direct detection that enables EELS and energy-filtered transmission electron microscopy (EFTEM) applications. The STEM instrument will include dual-EELS capabilities and high-speed spectroscopy, with simultaneous EELS/EDS acquisition.� The microscope will include an independent Descan system (coils and control) post-specimen. This allows large areas to be mapped by EELS without artifacts caused by the shifting of the EELS spectrum on the spectrometer. Electrostatic dose modulator for control of specimen dose The modulator shall be a commercially-available product to retrofit onto the microscope and synchronized to function in both TEM and STEM modes. Thw system enables dose control without altering the illumination conditions of the microscope using real-time, user-controlled continuously-adjustable settings. The dose modulator must be capable of ultrafast beam blanking, < 50 ns. The due date for responses is extended to May 21, 2021. Interested organizations may submit their capabilities and qualifications to perform the effort electronically via email to Amanda Graziosi at amanda.l.graziosi@nasa.gov. Offerors are responsible for monitoring this site for the release of the solicitation and any amendments.�� Potential offerors are responsible for downloading their own copy of the solicitation and amendments (if any).
- Web Link
-
SAM.gov Permalink
(https://beta.sam.gov/opp/a01f9ccdc07343cd85e1de53f817bc08/view)
- Place of Performance
- Address: Houston, TX 77058, USA
- Zip Code: 77058
- Country: USA
- Record
- SN06002178-F 20210516/210514230114 (samdaily.us)
- Source
-
SAM.gov Link to This Notice
(may not be valid after Archive Date)
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