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SAMDAILY.US - ISSUE OF FEBRUARY 02, 2020 SAM #6639
SOLICITATION NOTICE

66 -- Low Temperature Measurement System

Notice Date
1/31/2020 1:06:15 PM
 
Notice Type
Presolicitation
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
FERMILAB - DOE CONTRACTOR Batavia IL 60510 USA
 
ZIP Code
60510
 
Solicitation Number
CR-300385-Notice
 
Response Due
2/17/2020 8:00:00 AM
 
Archive Date
03/03/2020
 
Point of Contact
Chris Rossman, Phone: 6308405355
 
E-Mail Address
crossman@fnal.gov
(crossman@fnal.gov)
 
Description
Fermilab is looking for vendors to provide an atomic force microscope (AFM) that is capable to measure with suitable attachments�for advanced material characterization, doping process optimization, as well as layered structures for�research on primarily bulk niobium and layered Nb-dielectric metal samples.� Genernal purpose of the AFM system is to measure different surface properties�from a variety of samples. Combination of these measurement modes in one complete system provides great advantage of live high-resolution evaluation of superconducting samples. Vendors ineterested in providing this equipment should contact the Procurement Specialist list.
 
Web Link
SAM.gov Permalink
(https://beta.sam.gov/opp/53f63cb21c5d4e50b9fb5a7be6d45728/view)
 
Place of Performance
Address: Batavia, IL 60510, USA
Zip Code: 60510
Country: USA
 
Record
SN05549284-F 20200202/200131230138 (samdaily.us)
 
Source
SAM.gov Link to This Notice
(may not be valid after Archive Date)

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