SPECIAL NOTICE
66 -- Deep Data in Scanning Probe Microscopy and Software
- Notice Date
- 2/3/2017
- Notice Type
- Special Notice
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Energy, Oak Ridge National Laboratory - UT Battelle LLC (DOE Contractor), Oak Ridge National Laboratory, Bethel Valley Road, P.O. Box 2008, Oak Ridge, Tennessee, 37831-6192
- ZIP Code
- 37831-6192
- Solicitation Number
- ORNL-TT-2017-01
- Archive Date
- 3/24/2017
- Point of Contact
- Eugene Cochran, Phone: 865-576-2830, Jennifer T. Caldwell, Phone: 865-574-4180
- E-Mail Address
-
cochraner@ornl.gov, caldwelljt@ornl.gov
(cochraner@ornl.gov, caldwelljt@ornl.gov)
- Small Business Set-Aside
- N/A
- Description
- ORNL-TT-2017-01 ORNL 201403336 - Deep Data in Scanning Probe Microscopy: "G-mode" Getting All the Data During SPM Imaging; ORNL 201503568 - General Full Acquisition High-Speed Spectroscopy for Scanning Probe Microscopy; Copyright Document Number 50000128 or CR16-00056: Band Excitation for Scanning Probe Microscopy UT-Battelle, LLC, acting under its Prime Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy (DOE) for the management and operation of the Oak Ridge National Laboratory (ORNL), is seeking commercialization partners for its deep data scanning probe microscopy technology including software for Scanning Probe Microscopy. Hardware: The invention relates to Scanning Probe Microscopy and more specifically to information-theory analysis of the cantilever output stream. We introduce a novel concept for SPM data acquisition based on acquisition and multivariate analysis and compression of the entire response of the cantilever in time. The use of multivariate statistical methods such as PCA, allows to guide a data sampling strategy and attain insight into how the data is structured in space, frequency, and information domains. Software: The Band Excitation (BE) technique for scanning probe microscopy uses a precisely determined waveform that contains specific frequencies to excite the cantilever or sample in an atomic force microscope to extract more information, and more reliable information from a sample. There are a myriad of details and complexities associated with implementing the BE technique. It is desirable to have a user friendly interface that allows typical microscopists access to this methodology. This software enables users of atomic force microscopes to easily: build complex band-excitation waveforms, set-up the microscope scanning conditions, configure the input and output electronics for generate the waveform as a voltage signal and capture the response of the system, perform analysis on the captured response, and display the results of the measurement. License applications will be evaluated based on prospective partners' ability and commitment to successfully commercialize the technology, with a preference for United States-based businesses and small businesses. For additional information and license application, contact Eugene Cochran, Commercialization Manager, Oak Ridge National Laboratory, cochraner@ornl.gov, 865-576-2830. ORNL201403336, ORNL201503568 and Copyright Document Number 50000128. Resources 1) Fact Sheet - Deep Data in SPM 2) Fact Sheet - Band Excitation for SPM Current Intellectual Property: Non-Provisional US Patent Application Serial No.: 15/063,144 filed on 03/07/2016 entitled, "Full Information Acquisition in Scanning Probe Microscopy and Spectroscopy." Copyright Document Number 50000128
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOE/ORNL/ORNL/ORNL-TT-2017-01/listing.html)
- Place of Performance
- Address: Oak Ridge National Laboratory, One Bethel Valley Road, Oak Ridge, Tennessee, 37831, United States
- Zip Code: 37831
- Zip Code: 37831
- Record
- SN04390396-W 20170205/170203234110-da0d509018fd57f22835a5d05ae2194b (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
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