SOURCES SOUGHT
66 -- Sources Sought for an X-Ray Photoelectron Spectroscopy (XPS) System
- Notice Date
- 11/13/2015
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of the Army, Army Contracting Command, ACC - APG - Adelphi, 2800 POWDER MILL RD, ADELPHI, Maryland, 20783-1197, United States
- ZIP Code
- 20783-1197
- Solicitation Number
- W911QX-16-T-0025
- Archive Date
- 12/5/2015
- Point of Contact
- Cristina M. Watkins, Phone: 301-394-2529, Rebecca Patterson, Phone: 301-394-5351
- E-Mail Address
-
cristina.m.watkins.civ@mail.mil, rebecca.patterson13.ctr@mail.mil
(cristina.m.watkins.civ@mail.mil, rebecca.patterson13.ctr@mail.mil)
- Small Business Set-Aside
- N/A
- Description
- This is a Sources Sought Notice only. This is not a request for proposal, but a survey to locate potential sources. This Sources Sought does not constitute an Invitation for Bids, Request for Proposals, or a Request for Quotations, and is not to be construed as a commitment by the Government to issue an order or otherwise pay for the information solicited, nor is it a guarantee of a forthcoming solicitation or contract. It is for market research purposes only. Respondents will not be notified of the results of the evaluation. The purpose of this Sources Sought Notice is to gain knowledge of interest, capabilities, and qualifications of various members of industry, to include the Small Business Community: Small Business, Section 8(a), Historically Underutilized Business Zones (HUB-Zone), Service-Disabled Veteran-Owned Small Business (SDVOSB), Women-Owned Small Business (WOSB), and Economically Disadvantaged Women-Owned Small Business (EDWOSB). The Government must ensure there is adequate competition among the potential pool of responsible contractors. Small business, Section 8(a), HUBZone, SDVOSB, WOSB, & EDWOSB businesses are highly encouraged to participate. A. Objective: To find sources that are qualified to meet the supplies/services as listed in section 11B. Note that the specific requirements in section C are subject to change prior to the release of any solicitation. B. Salient Characteristics The Contractor shall provide an X-ray Photoelectron Spectroscopy (XPS) Scanning Microprobe System, based on the minimum requirements below: Item 1: XPS Scanning Microprobe System 1. A monochromatic aluminum anode K-alpha X-ray source with the follow specifications: a. A source defined raster scanned, micro focused, monochromatic x-ray beam down to ten (10) micrometer (µm) spot size that allows for complete survey spectra for elemental identification and quantitative analysis, high energy resolution spectra in the scanned or snapshot detection mode for detailed chemical analysis, multi-element sputter depth profiles, line scans, and images. b. Ability to move the x-ray beam up to one (1) millimeter (mm) deflection for multi-point analysis without movement of the sample stage. 2. Secondary Electron Imaging a. Scanning X-ray beam induced secondary electron imaging for defining sample analysis area. 3. Optical imaging for defining and documenting sample analysis area. 4. A combination of titanium sublimation pumps, ion pumps and mechanical rotary pumps can be used to achieve an Ultra-High Vacuum (UHV) chamber pressure of ≤ 5x10-10 Torr. 5. Sample transfer chamber with an intro ion pressure gauge able to out-gas sample and document pressures. 6. High transmission electrostatic energy analyzer input lens for providing energy resolution ≤ 0.5 electron volt (eV) on the Silver (Ag) 3d5/2 photoemission line. The analyzer cannot use aperture(s) that reduces collection efficiency as a function of analysis area, and only the incoming x-ray source to the sample can define the area of analysis. 7. Dual beam (low energy electrons combined with low energy argon ions) charge neutralization capabilities for accurate determination of binding energy. The energy of the argon ions must be below the energy threshold for sputtering, to ensure the maximum energy transfer of the ion to the sample atom equals the binding energy of a surface atom. 8. Automatic sample alignment to analyzer and incoming X-ray probe. The instrument must be able to automatically align at each analysis point and/or each sample down to the ≤ 10µm spot size. 9. Automated high-precision multi-sample stage with the following specifications: a. A 5-axis motorized stage with 0-90° sample tilt for angle resolved XPS. b. Must enable all XPS functions on varying sample types with sample thicknesses up to 10mm (including films, polymers, conductive and on-conductive materials). c. Sample rotation (compucentric) for depth profiling to enable sampling at a fixed point. 10. Micro area depth profiling to include: a. Ability to move the X-ray beam during depth profiling for multi-point analysis without movement of the stage. b. Only the area of analysis/interest can be exposed to the X-ray probe during profiling. 11. Monoatomic Argon (Ar+) ion gun with neutral filter capable of producing ions from 20-5000 volts (V) for sputtering and depth profiling. 12. C60 cluster source with 20kV or greater acceleration potential for sputtering and depth profiling of organic and inorganic films simultaneously. The following conditions must be met: a. The C60 source cannot contain hydrocarbon species. b. The C60 source must be capable of sputtering alternating layers of inorganic and organic films at a similar sputter rate. 13. Vacuum transfer vessel that enables the movement of air sensitive samples in a controlled environment. Item 2: Computer & Software for XPS Scanning Microprobe System 14. Computer must have the following specifications: a. Quantity one (1) with an operating system of Windows 7 or better b. Computer must contain both USB drives and a recordable/erasable DVD drive c. A minimum of one (1) color wide-screen Liquid Crystal Display (LCD) monitor 15. Software must include the below specifications: a. Must include one (1) license for software to operate the instrument and two (2) licenses for software to perform quantitative/qualitative determinations listed below. b. Must be compatible with Windows 7. c. Must control sampling stage and X-ray source. d. Must be able to perform the following quantitative/qualitative routines: i. Peak identification and quantitative composition determination. ii. Peak deconvolution with option for different types of fitting (e.g., Gaussian, Gaussian-Lorentz, etc.) and background subtraction iii. Smoothing and differentiation iv. Multi-point sample analysis Item 3: Delivery and Installation 16. Delivery & Installation a. The Contractor shall deliver the XPS system to Building 207 within the Army Research Laboratory (ARL) at the Adelphi Laboratory Center (ALC). b. Within two (2) weeks from delivery of the XPS system, the Contractor shall be notified by the Technical Point of Contact (TPOC) for scheduling of installation. c. The Contractor shall demonstrate to the TPOC that the XPS system is fully functional after the system has been installed and meets the specifications listed above. Item 4: On-Site Training and Maintenance 17. On-Site Training a. The Contractor shall perform two (2) full days (16 hours) of operation and maintenance training. This training shall include verification that the performance requirements are met including system pressures, resolution at the Ag 3d5/2 photoemission line, optical imaging capability, secondary imaging capability, mapping capability, angle resolved capability, and depth profiling with Ar+ and C60 sources. The training shall take place within three (3) weeks of installation or mutually agreed time. 18. Troubleshooting and Maintenance a. For the duration of the Government's ownership of the XPS system, the Contractor shall provide technical support for questions regarding operation, hardware troubleshooting, and software operation via telephone or email during normal business hours. Technical assistance shall be provided within two (2) business days of original contact. 19. Manuals a. Instructional manual(s), which describe system design and operation for all components, shall be provided in either digital or paper form. b. Instructional manual(s) for the data acquisition and analysis software shall be provided in either digital or paper form. C. Responses: All interested parties should notify this office via FedBizOpps website or e-mail (cristina.m.watkins.civ@mail.mil) by closing date listed below. Responses shall include: (I) To what extent each of the specifications can be met. (II) Include your type of business (i.e. commercial, academia), whether your organization is classified as a large or small business based on the 500 employees standard that accompanies NAICS code 334516. If a small business, you must also list any small disadvantaged status you hold [HUBZone, 8(a), Service Disabled Veteran Owned Small Business (SDVOSB), Women Owned Small Business (WOSB), Economically Disadvantaged Women-Owned Small Business (EDWOSB), etc.]. (III) Past experience/ performance through the description of completed projects. (12) Responses to this sources sought synopsis are due no later than 10:00AM eastern standard time 19 November 2015. Submissions should be submitted online via the FedBizOpps website or emailed to Cristina M. Watkins, Contract Specialist at cristina.m.watkins.civ@mail.mil. Questions concerning this sources sought synopsis may be directed to Cristina Watkins, 301-394-2529, cristina.m.watkins.civ@mail.mil. Please be advised that.zip and.exe files cannot be accepted. (13) Estimated Delivery Timeframe or Period of Performance: Nine (9) Months after receipt of order (ARO).
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/notices/1b96049f276c841374e18d2a7489783a)
- Place of Performance
- Address: U.S. Army Research Laboratory, Adelphi Contracting Division, 2800 Powder Mill Road, Adelphi, Maryland, 20783, United States
- Zip Code: 20783
- Zip Code: 20783
- Record
- SN03945839-W 20151115/151113234542-1b96049f276c841374e18d2a7489783a (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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