SPECIAL NOTICE
99 -- TECHNOLOGY TRANSFER OPPORTUNITY SUBSURFACE IMAGING OF NANOCOMPOSITES VIARESONANT DIFFERENCE-FREQUENCY ATOMIC FORCE ULTRASONIC MICROSCOPY-- RDF-AFUM
- Notice Date
- 12/10/2013
- Notice Type
- Special Notice
- NAICS
- 927110
— Space Research and Technology
- Contracting Office
- NASA/Langley Research Center, Mail Stop 12, Industry Assistance Office, Hampton,VA 23681-0001
- ZIP Code
- 23681-0001
- Solicitation Number
- TT01040
- Archive Date
- 12/10/2014
- Point of Contact
- Jesse C Midgett, Program Specialist, Phone 757-864-3936, Fax 757-864-8314, Email j.midgett@nasa.gov
- E-Mail Address
-
Jesse C Midgett
(j.midgett@nasa.gov)
- Small Business Set-Aside
- N/A
- Description
- Synopsis: NASA Langley Research Center in Hampton, VA solicits inquiries from companies interested in obtaining license rights to commercialize, manufacture and market the following technology. License rights may be issued on an exclusive or nonexclusive basis and may include specific fields of use. THE TECHNOLOGY: Scientists at NASA Langley Research Center have developed NASA Langley has developed a new non-destructive method for characterizing nanomaterials. Based on modified atomic force ultrasonic microscopy (AFUM) methods, the technology allows imaging and quantifying of material properties at the surface and subsurface levels. NASA developed the technology to reveal the orientation of nanotubes within a composite structure. The technology offers the ability to determine subsurface characteristics without destroying the nanomaterial structure. The method is widely applicable for basic nanomaterials characterization, including distribution and orientation of particles in a nanocomposite, localized elastic constants and changes in elastic constants, adhesive surface properties, sound velocity, and material damping coefficient. This new scanning probe microscope methodology is called resonant difference frequency atomic force ultrasonic microscopy (RDF-AFUM). It employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope engages the sample top surface. The cantilever is driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave at the sample surface generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create amplitude and phase-generated images of nanoscale near-surface and subsurface features. To express interest in this opportunity, please respond to LaRC-PatentLicensing@mail.nasa.gov with the title of this Technology Transfer Opportunity as listed in this FBO notice and your preferred contact information. Please also provide the nature of your interest in the technology along with a brief background of your company. For more information about licensing other NASA-developed technologies, please visit the NASA Technology Transfer Portal at http://technology.nasa.gov/. These responses are provided to members of NASA Langleys Office of Strategic Analysis and Business Development (OSACB) for the purpose of promoting public awareness of NASA-developed technology products, and conducting preliminary market research to determine public interest in and potential for future licensing opportunities. If direct licensing interest results from this posting, OSACB will follow the required formal licensing process of posting in the Federal Register. No follow-on procurement is expected to result from responses to this Notice.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/NASA/LaRC/OPDC20220/TT01040/listing.html)
- Record
- SN03248883-W 20131212/131210234209-b82cd834eec082ebddb25014bd7ebe7b (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |