SOLICITATION NOTICE
66 -- Scanning Electron Microscope with 3D view integration
- Notice Date
- 8/29/2013
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Health and Human Services, National Institutes of Health, National Institute on Drug Abuse, Station Support/Simplified Acquisitions, 31 Center Drive, Room 1B59, Bethesda, Maryland, 20892
- ZIP Code
- 20892
- Solicitation Number
- HHS-NIH-NIDA(SSSA)-CSS-2013-3033641
- Archive Date
- 9/24/2013
- Point of Contact
- Hunter A. Tjugum, Phone: 301 435 8780
- E-Mail Address
-
hunter.tjugum@nih.gov
(hunter.tjugum@nih.gov)
- Small Business Set-Aside
- N/A
- Description
- This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotations are being requested and a written solicitation will not be issued. The solicitation number is HHS-NIH-NIDA(SSSA)-CSS-2013-3033641 and the solicitation is issued as a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2005-69 effective August 1, 2013. This acquisition is for a commercial item or service and is conducted under Simplified Acquisition Procedures modified to reflect an acquisition conducted under the authority of FAR 13.5 Test Program for Certain Commercial Items. The associated NAICS code is 334516 with small business size standard 500 employees. The Neuronal Network Section at the National Institute on Drug Abuse (NIDA) has a requirement for a Scanning Electron Microscope (SEM) with 3D view integration. SEM is required to deliver high resolution surface information and a high materials contrast. The SEM is needed for electron microscopy sciences and application fields such as nanotechnology, materials analysis, semiconductor failure analysis, life sciences and quality assurance. The SEM requirement needs to achieve factory integrated quality with a 3D view mechanism and be able to meet the essential government features described in the following text. The SEM needs to achieve factory integrated quality with a 3D view capability. The 3D view, or 3view system, simplifies three-dimensional electron microscopy providing researchers with limited electron microscopy expertise an opportunity to collect high resolution volumetric datasets by removing the difficult step of cutting and collecting ultrathin sections. 3 View must ensure perfect integration between detector and SEM, with exchange potential at the SEM stage without service engineer assistance, and inside door mount of SEM stage mounted on inside of door to ensure rapid, user assisted exchange. This requirement must also achieve the following technical specifications and features: Cross-over free beam path able to achieve Large Flat Field images, up to 32k by 24k images and a stable Low kV electron beam without stage biasing, capable of direct image correlation between multi-photon microscope via sample holder and integrated software High performance magnetic lens with an inserted electrostatic lens providing dramatic decrease of spherical and chromatic aberrations with decreasing AV (spherical and chromatic aberrations decrease with lower AV) and objective lens design with minimum magnetic field at the specimen surface High-resolution imaging of dia-, para-, or ferromagnetic samples, in any composition and together with other materials, at short working distances and low AV, and high resolution imaging of ferromagnetic steel @ WD = 3 mm; AV = 1 kV @ 100.000x Mag Objective lens with conical final lens of at least 80 deg, allowing 50 deg tilt of large specimens at a working distance of 6 mm and analytical working distance for EDX-analysis with a take-off angle of 35 deg of 8.5 mm Imaging with BSE-detector simultaneously with EDX @ 8.5 mm WD Lens design allowing large fields of view can be observed, from 12x to 1,000,000x, with zooming over the full Mag-range possible without switching-off lenses, changing WD or refocusing Magnification accuracy 1% or better Beam path to allow cross-over free in order to minimize the statistical Coulomb interactions between beam electrons, with no Boersch effect Beam booster as integral part of the electron optical column maintaining a high energy throughout the entire column with no loss of brightness observed at any landing energy down to 20 V AV Electromagnetic 6-hole aperture changer incorporated close to emitter system Compact column design with integrated Mu-metal shielding to limit sensitivity to stray fields, and to reduce susceptibility to vibrations Water-cooling ability of lenses to obtain highest system stability with system stability equal or better than 0.2 %/hour Field emission emitter (thermionic) to obtain high brightness, low energy spread combined with the capability to deliver high probe currents Maximum probe current of 20 nA or optionally 100 nA in high vacuum Automatic emitter run-up procedure to ensure a safe controlled run-up of the target emitter conditions, protected against high currents, with automatic shut-off to prevent overloads Contractor shall delivery the item(s) FOB destination within six (6) months after receipt or order to the Bayview Medical Campus at 251 Bayview Blvd, Baltimore, MD 21224. Quotations from Offerors will be evaluated on the ability to meet the essential government requirements listed in this solicitation. Quotations will be evaluated on basis of best value to the Government in relation to pricing. The following FAR provisions shall apply to this solicitation: 52.212-1, Instructions to Offerors--Commercial Items, 52.212-2, Evaluation--Commercial Items. Offerors must include a completed copy of the provision at 52.212-3, Offeror Representations and Certifications Commercial Items, with its offer. The Clause at 52.212-4, Contract Terms and Conditions Commercial Items, applies to this acquisition and the Clause at 52.212-5, Contract Terms and Conditions Required to Implement Statutes or Executive Orders Commercial Items applies to this acquisition. In order to be considered for award, the offeror must have completed the electronic annual Representations and Certifications requirement in accordance with FAR 4.1201(a). By submission of an offer, the offeror acknowledges the requirement that prospective awardees shall be registered in the federal System of Award Management (SAM), located at https://www.sam.gov prior to award, during performance, and through final payment of any contract, basic agreement, basic ordering agreement, or blanket purchasing agreement resulting from this solicitation. Please reference the HHS-NIH-NIDA(SSSA)-CSS-2013-3033641 on all correspondence and transmittals submitted for this solicitation. Quotations are to be sent electronically to hunter.tjugum@nih.gov prior to the closing date of this announcement.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/HHS/NIH/NIDA-2/HHS-NIH-NIDA(SSSA)-CSS-2013-3033641/listing.html)
- Record
- SN03168916-W 20130831/130830000850-07670692f32269c197897f5f6901477a (fbodaily.com)
- Source
-
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