SOURCES SOUGHT
66 -- Scanning Electron Microscope with 3D view integration
- Notice Date
- 8/21/2013
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Health and Human Services, National Institutes of Health, National Institute on Drug Abuse, Station Support/Simplified Acquisitions, 31 Center Drive, Room 1B59, Bethesda, Maryland, 20892
- ZIP Code
- 20892
- Solicitation Number
- HHS-NIH-NIDA(SSSA)-SS-2013-3033641
- Archive Date
- 9/12/2013
- Point of Contact
- Hunter A. Tjugum, Phone: 301 435 8780
- E-Mail Address
-
hunter.tjugum@nih.gov
(hunter.tjugum@nih.gov)
- Small Business Set-Aside
- N/A
- Description
- The National Institute on Drug Abuse (NIDA) is seeking responses to this Sources Sought notice. This is NOT a solicitation for proposals, proposal abstracts, or quotations. The purpose of this notice is to obtain information regarding the availability and capability of all qualified sources to provide a potential requirement. Based on the responses received from this Sources Sought notice, the proposed acquisition may be solicited as a Total Small Business Set-Aside. All eligible small business concerns responding to this announcement must have the capabilities to provide the below product for delivery to the Biomedical Research Center in Baltimore, MD. The Neuronal Network Section at NIDA has a potential requirement for a Scanning Electron Microscope with 3D view integration. The essential government feature which this requirement needs to achieve is the factory integrated quality of the SEM with a 3D view mechanism, that meets the essential government features described in the following text. The Scanning Electron Microscope (SEM) is required to deliver high resolution surface information and a high materials contrast. The SEM is needed for electron microscopy sciences and application fields such as nanotechnology, materials analysis, semiconductor failure analysis, life sciences and quality assurance. This potential government requirement for SEM consists of the need to achieve the following additional essential features: Cross-over free beam path able to achieve Large Flat Field images, up to 32k by 24k images, and a stable Low kV electron beam without stage biasing, capable of direct image correlation between multiphoton microscope via sample holder and integrated software Lens design consisting of a high performance magnetic lens with an inserted electrostatic lens, providing dramatic decrease of spherical and chromatic aberrations with decreasing AV (spherical and chromatic aberrations decrease with lower AV); with objective lens design with minimum magnetic field at the specimen surface High-resolution imaging of dia-, para-, or ferromagnetic samples, in any composition and together with other materials, at short working distances and low AV. High resolution imaging of ferromagnetic steel @ WD = 3 mm; AV = 1 kV @ 100.000x Mag The objective lens with conical final lens of at least 80 deg, allowing 50 deg tilt of large specimens at a working distance of 6 mm and analytical working distance for EDX-analysis with a take-off angle of 35 deg of 8.5 mm. Imaging with BSE-detector simultaneously with EDX @ 8.5 mm WD. Lens design allowing large fields of view can be observed, from 12x to 1,000,000x, with zooming over the full Mag-range possible without switching-off lenses, changing WD or refocusing. The magnification accuracy 1% or better Beam path to allow cross-over free in order to minimize the statistical Coulomb interactions between beam electrons, with no Boersch effect Contain beam booster has integral part of the electron optical column maintaining a high energy throughout the entire column with no loss of brightness observed at any landing energy down to 20 V AV. Electromagnetic 6-hole aperture changer incorporated close to emitter system Compact column design with integrated Mu-metal shielding to limit sensitivity to stray fields, and to reduce susceptibility to vibrations Water-cooling of the lenses to obtain highest system stability with system stability equal or better than 0.2 %/hour Contain field emission emitter (thermionic) to obtain high brightness, low energy spread combined with the capability to deliver high probe currents Maximum probe current of 20 nA or optionally 100 nA in high vacuum. Automatic emitter run-up procedure to ensure a safe controlled run-up of the target emitter conditions, protected against high currents, with automatic shut-off to prevent overloads. The SEM needs to achieve factory integrated quality with a 3D view capability. The 3D view, or 3view system, simplifies three-dimensional electron microscopy providing researchers with limited electron microscopy expertise an opportunity to collect high resolution volumetric datasets by removing the difficult step of cutting and collecting ultrathin sections. 3 View must ensure highest quality integration between detector and SEM, with exchange potential at the SEM stage without service engineer assistance, and inside door mount of SEM stage mounted on inside of door to ensure rapid, user assisted exchange. Interested parties should submit a tailored capability statement, which clearly defines the ability to provide the items described in this potential requirement, and to satisfy the essential government feature(s). Responses should be limited to 15 pages in length, including attachments, and sent as an Adobe PDF or Microsoft Office file to: tjugumha@mail.nih.gov prior to the closing date contained in this announcement. Responses must include the respondents' DUNS, organization name and address, point of contact, and size and type of business pursuant to the North American Industry Classification System (NAICS) code identified in this notice. Disclaimer and Important News: This notice does not obligate the Government to award a contract or otherwise pay for the information provided in response. The Government reserves the right to use information provided by respondents for any purpose deemed necessary and legally appropriate. Any organization responding to this notice should ensure that its response is complete and sufficiently detailed to allow the Government to determine the organization's qualifications to perform the work. Respondents are advised that the Government is under no obligation to acknowledge receipt of the information received or provide feedback to respondents with respect to any information submitted. After a review of the responses received, a pre-solicitation synopsis and solicitation may be published in Federal Business Opportunities. However, responses to this notice will not be considered adequate responses to a solicitation. Confidentiality: No proprietary, classified, confidential, or sensitive information should be included in your response. The Government reserves the right to use any non-proprietary technical information in any resultant solicitation(s).
- Web Link
-
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