SOURCES SOUGHT
66 -- Semiconductor Device Characterization and Analysis System
- Notice Date
- 2/3/2012
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-12-SS14
- Archive Date
- 3/3/2012
- Point of Contact
- Lynda M Roark, Phone: 3019753725, Patrick K Staines, Phone: (301)975-6335
- E-Mail Address
-
Lynda.Roark@nist.gov, patrick.staines@nist.gov
(Lynda.Roark@nist.gov, patrick.staines@nist.gov)
- Small Business Set-Aside
- Total Small Business
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a Semiconductor Device Characterization and Analysis System (System) which is required in the Center for Nanoscale Science and Technology (CNST) NanoFab for parametric test and device characterization in a multi-user environment. The diversity of tests needed to support user requirements, as well as equipment qualification, demands a tool that can provide a broad range of test and measurement capability in a single integrated solution. Users perform a wide range of electrical characterization tests including but not limited to capacitance/voltage (CV Sweep or C-t sampling), current/voltage (IV Staircase or Multi-channel Sweep), multi-frequency capacitance/voltage (C-f Sweep), and pulse testing (Pulsed sweep or Staircase sweep with pulsed bias) of devices with between 2 and 5 connections. The System will interface with an existing manual probe station using non-kelvin triax connections. To facilitate ease of use for the majority of measurement requirements, the System must contain an integrated low noise matrix switch giving users the flexibility to select the source and probe configuration in the System software without the need to change cables. Measurements will be made on semiconductor wafers and may require front side only connections or front and backside (through a low noise chuck) connections. After results of this market research are obtained and analyzed and specifications are developed for the Semiconductor Device Characterization and Analysis System that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. NIST has a need for a Semiconductor Device Characterization and Analysis System that would meet the following minimum requirements: • Shall include four (4) High Resolution source measurement units with the following capability: • Source Maximum: +/-100V, +/-0.1A • Measurement Resolution: 0.5uV, 1fA • Triax cable connection • Shall include two (2) High Power source measurement units with the following capability: • Source Maximum: +/-200V, +/-1A • Measurement Resolution: 2uV, 10fA • Triax cable connection • Shall iinclude one (1) Multi-Frequency Capacitance Measurement Unit with the following capability: • Measurement Frequencies between 1kHz and 5MHz • Output signal: 10mV to 250mV • DC Bias: +/-25V Internal, +/-100V with external SMU connection • BNC cable connection • Shall include one (1) High Voltage Pulse Generator Unit with the following capability: • Two output channels • Output voltage range: +/-20V • Pulse Period: 30nSec to 10 Sec • Pulse Width: 10nSec to 10 Sec • SMA cable connections • Shall include one (1) Low Noise Multi-Channel Switch Matrix with the following capability: • 8 input channels minimum • 6 output channels minimum • Maximum Signal Level: +/-200V, +/-1A • Maximum Leakage: 0.1pA/V • Triax cable connections • General Hardware Requirements: • 120V, 60Hz operation • All equipment must be rack mountable • All cables and adapters required to connect System to four (4) triax probes and one (1) triax measurement chuck provided. • System must have capability to use external video monitor, keyboard, and mouse. • Interlock cable to interface manual prober to System to ensure safe high voltage operation. • Software Requirements: • Must have integrated control of all System components including switching matrix. • Must have pre-defined tests to demonstrate each hardware feature. • Must support custom defined test plans and save test plans locally. • Must support saving user test data to common export format such as excel or plain text format. • Measurement Requirements: • Quasi-static capacitance-voltage sweep measurement • High frequency capacitance-voltage sweep measurement at various frequencies • IV Sweep • Pulse Sweep NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code 334516 for this effort, as those domestic sources having 500 employees or less. Please include your company's size classification in any response to this notice. Companies that manufacture Semiconductor Device Characterization and Analysis Systems are requested to email product literature describing their capabilities to provide equipment meeting our need described above to Lynda.Roark@nist.gov no later than the response date for this sources sought notice. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components if you are the manufacturer, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to Lynda.Roark@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider during the market research phase. Point of Contact Lynda Roark, Contracting Specialist, Phone (301) 975-3725, Fax (301) 975-8753, Email Lynda.Roark@nist.gov
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-12-SS14/listing.html)
- Place of Performance
- Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02667333-W 20120205/120203234317-bcf86a0878def4aa117d6825816fa85a (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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