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FBO DAILY ISSUE OF MARCH 31, 2011 FBO #3414
SPECIAL NOTICE

66 -- Intent to Sole Source

Notice Date
3/29/2011
 
Notice Type
Special Notice
 
NAICS
334516 — Analytical Laboratory Instrument Manufacturing
 
Contracting Office
US Army Medical Research Acquisition Activity, ATTN: MCMR-AAA, 820 Chandler Street, Frederick, MD 21702-5014
 
ZIP Code
21702-5014
 
Solicitation Number
W81XWH000T0000
 
Archive Date
6/27/2011
 
Point of Contact
Jacklyn McGurk, 410-417-2604
 
E-Mail Address
US Army Medical Research Acquisition Activity
(jacklyn.mcgurk@amedd.army.mil)
 
Small Business Set-Aside
N/A
 
Description
The United States Army Medical Research Acquisition Activity (USAMRAA) intends to negotiate a firm fixed price award on a sole source basis, IAW FAR 13.501 under the authority of the test program for commercial items (section 4202 of the Clinger-Cohen Act of 1996). JEOL USA, Inc, 11 Dearborn Rd, Peabody, MA 01961-6043, has been identified as the only responsible souce that can provide the unique, customized JEOL JEM-1400 Transmission Electron Microscope and JEOL JSM-7600F Field Emission Scanning Electron Microscope. Responsible firms may identify their interest and submit a capability statement to respond to future requirements. Submit email capability statements (using PDF, MS Word, Excel attachments) to Jackie McGurk at, Jacklyn.McGurk@amedd.army.mil. Fax statements may be sent to 410-436-4863; Attn: Jackie McGurk. Email statements are preferred. Statements are due no later than 5:00 P.M. EST on 22 APRIL 2011. No telephone calls will be accepted. This Notice of Intent is not a request for competitive proposals. However, information received within 15 days after date of publication of this synopsis will be considered by the government. A determination by the Government not to compete this proposed award is solely within the discretion of the government. Information received will normally be considered solely for the purpose of determining whether to conduct a future competitive procurement. JEOL JEM-1400 Transmission Electron Microscope, are: object-oriented and function-oriented graphical user interface; double o-ring specimen holder configuration for differentially pumped airlock system; differentially pumped airlock system that will, if pre-pumped for 3 minutes or more with filled cryo-trap prior to specimen insertion, recover to the original microscope vacuum value in the 10-5 Pascal range within 15 seconds of specimen insertion; tension-free specimen holding system for cantilever-style microactive goniometer; microactive goniometer with 5-axis control; specimen holder with exchangeable tips for special application such as tomography; independently controlled optical functions to include lenses, stigmators and alignment coils with value memorization and recall capabilities for customized operating conditions; interchangeable specimen holders with JEOL-1230 transmission electron microscope. The following operational specifications and components are unique to the JEOL JSM-7600F Field Emission Scanning Electron Microscope, are: conical in-lens anode for shift and gun alignment minimization while changing accelerating voltages; automated computer controlled convergence angle (aperture angle) control lens which optimizes the probe diameter as a function of kV, WD, and CL setting in order to achieve high performance at low kV, long WD and at larger probe currents; lens that will maintain the minimum probe size for a given probe current automatically with no user intervention; an additional setting for high current operation (analytical conditions) with automatic alignment to minimize scattered x-ray generation; lens that allow the probe current to be varied from less than 1x10-12Amps (Pico Amps) to 0.5x10-9 Amps (Nano Amps) with no change in probe diameter; lens that will have user adjustment for large depth of field mode; liquid nitrogen cold finger that resides below the OL pole piece surface to act as an anticontaminator cold trap (provided as standard); the ability to add a Faraday cup into the column just below the objective lens aperture for the purpose of measuring true probe current with graphical read out in the SEM control software; a low angle, retractable, solid state backscattered electron detector (provided as standard); a stage that is capable of meeting all resolution specifications without a stage lock or clamp; a specimen stage that incorporates a vibration dampener that is always in place & active and that does not restrict any stage axis movement; a built in active real time feedback vibration cancellation device; a battery backup power supply supplied standard for the ion pumps eliminating the need for gun bake-out and realignment after an extended power outage; fully interchangeable sample holders with our existing FESEM (JSM-7401F) without the need for adapters or modifications.
 
Web Link
FBO.gov Permalink
(https://www.fbo.gov/spg/USA/USAMRAA/DAMD17/W81XWH000T0000/listing.html)
 
Record
SN02411783-W 20110331/110329234601-250dae60bd930546d13e75398535ae7f (fbodaily.com)
 
Source
FedBizOpps Link to This Notice
(may not be valid after Archive Date)

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