MODIFICATION
66 -- Schottky-type Field Emission Scanning Electron Microscope
- Notice Date
- 7/8/2010
- Notice Type
- Modification/Amendment
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SB1341-10-RQ-0160
- Archive Date
- 7/31/2010
- Point of Contact
- Paula Wilkison, Phone: 301-975-8448, Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
paula.wilkison@nist.gov, todd.hill@nist.gov
(paula.wilkison@nist.gov, todd.hill@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The purpose of this amendment is to answer questions posed by potential quoters. Question: Regarding specification 2.b in the Minimum Requirements: Can you clarify precisely what is meant by "Image rotation through hardware"? We assume this means electronic scan/image rotation, but would like clarification. Answer: Yes, this means electronic scan/image rotation. Question: Regarding specification 3.a.iii in the Minimum Requirements: Can you please specify the time period for the 1μm stage stability requirement? Question: The specification reads, “The stage shall be stable under temperature controlled laboratory (<1º C per hour) to better than 1 μm as measured using the electron beam imaging a point on the stage.” We’re not sure what this means. Can they expand on this? (How long, etc.) Answer (to both questions above): This requirement is designed to specify a maximum amount of drift as evident in an image over a period of one hour. The vendor should be able to demonstrate that in a room stable to 1º (plus/minus 0.5 º) that an image collected at any time during the one-hour period will not be spatially shifted from an image collected at the start of the hour by more than 1 µm. One acceptable way to do this is to image a sub-micron feature at one minute intervals at a field-of-view of approximately 10 µm. Locate the same feature on each image in pixel-based coordinates. Transform the pixel-based coordinates into calibrated µm and then plot the linear distance the feature shifts as a function of time in calibrated µm. A plot of such a test would be adequate evidence. All terms and conditions of the original solicitation, including closing date, remain unchanged and in full effect.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB1341-10-RQ-0160/listing.html)
- Place of Performance
- Address: TBD, United States
- Record
- SN02200236-W 20100710/100708235655-0078dce3fe4d6bddd4f42b4408a7b6c4 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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