SOLICITATION NOTICE
66 -- Atomic Force-Scanning Electrochemical Microscope-Raman Spectroscopy System
- Notice Date
- 7/8/2010
- Notice Type
- Combined Synopsis/Solicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SB1341-10-RQ-0462
- Archive Date
- 9/30/2010
- Point of Contact
- Joni L Laster, Phone: 301-975-8397, Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
joni.laster@nist.gov, todd.hill@nist.gov
(joni.laster@nist.gov, todd.hill@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- THIS IS A COMBINED SYNOPSIS/SOLICITATION FOR COMMERCIAL ITEMS PREPARED IN ACCORDANCE WITH THE FORMAT IN FAR SUBPART 12.6-STREAMLINED PROCEDURES FOR EVALUATION AND SOLICITATION FOR COMMERCIAL ITEMS-AS SUPPLEMENTED WITH ADDITIONAL INFORMATION INCLUDED IN THIS NOTICE. THIS ANNOUNCEMENT CONSTITUTES THE ONLY SOLICITATION; QUOTATIONS ARE BEING REQUESTED, AND A WRITTEN SOLICITATION DOCUMENT WILL NOT BE ISSUED. THE SOLICITATION IS BEING ISSUED USING SIMPLIFIED ACQUISITION PROCEDURES UNDER THE AUTHORITY OF FAR 13.5 TEST PROGRAM FOR CERTAIN COMMERCIAL ITEMS. This solicitation is a Request for Quotation (RFQ). The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2005-41. The associated North American Industrial Classification System (NAICS) code for this procurement is 334516 with a small business size standard of 500 employees. This requirement is unrestricted and all interested Contractor's may submit a quote. The National Institute of Standards and Technology is seeking to purchase an Atomic Force-Scanning Electrochemical Microscope-Raman Spectroscopy System. BACKGROUND The National Institute of Standards and Technology (NIST) has a requirement for an Atomic Force Microscope-Scanning Electrochemical Microscope-Raman Spectroscopy System (AFM-SECM-Raman) to be used in the energy research program at NIST Center for Nanoscale Science and Technology, Gaithersburg, MD. The main purpose of the system is to enable spectro-electrochemical characterization of electrocatalytic processes in liquid media with high spatial and chemical resolution. The AFM-SECM-Raman System shall consist of an AFM capable of imaging surface morphology in liquid and air environment using contact and tapping modes; capable of measuring the local electrochemical activity on surfaces and mapping this activity as a function of position and correlating such maps to morphology and chemical composition as determined with Raman spectroscopy; capable of collecting current-voltage characteristics at select locations on dry specimens and mapping the local conductivity as a function of location, correlating the conductivity to morphology, and to composition as determined by Raman spectroscopy; capable of collecting Raman or photoluminescence spectra at arbitrary locations, as well as mapping select peaks as a functions of position The AFM-SECM-Raman System shall be equipped with the following capabilities: a. Atomic force microscopy in liquid and air. b. Scanning electrochemical microscopy with integrated potentiostat, liquid cell, counter and reference electrodes c. Raman microscopy/spectroscopy with three laser excitation lines (532 nm, 633 nm, 785 nm) and high resolution spectrometer/camera. Line Item 0001: Quantity One (1) Atomic Force-Scanning Electrochemical Microscope-Raman Spectroscopy System. The system must meet or exceed all of the minimum specifications identified herein. All equipment must be new. Used or remanufactured equipment will not be considered for award. All interested Offerors shall provide a quote for the following line item(s): LINE ITEM 0001: Quantity one (1) each AFM-SECM-Raman System which shall meet or exceed all of the following required specifications: 1. Atomic Force Microscopy. 1.1 AFM shall include automated tip tuning and approach, 3D and 2D (i.e. line scan) mapping of surface morphology over length scales ranging from tens of nanometers to tens of micrometers, a control system supporting contact, non-contact and phase imaging modes as well as several additional data channels, and a comprehensive software package for control, acquisition, and analysis of images. 1.2 The system shall accommodate samples of lateral dimensions of at least up to 1 cm ×1 cm and thicknesses up to 1 mm; the stage shall allow coarse specimen positioning with micrometer spatial resolution and nanometer scale fine positioning. The maximum scan range shall be at least 100 µm × 100µm. Independent tip positioning with over an area of 10 µm × 10 µm is required. 1.3 The AFM shall allow the user to use both Si micromachined tips as well as specialized probes intended for SECM (glass imbedded metal nanowire), provide lateral resolution of at least 100 nm routinely and 30 nm under optimum conditions when scanning with SECM probes and a lateral resolution of 1 nm under optimum conditions when using Si based probes; a height resolution of 0.5 nm or better is expected with either probe. 1.4 The microscope tip, feedback system and stage shall be compatible with scanning in liquid media and air ambient. The liquid media shall include dilute acidic and basic solutions, as well as organic solvents. 2. Scanning Electrochemical Microscopy. 2.1 The SECM shall include the ability to record approach curves, I-E (cyclic voltammetry) curves at set tip-substrate distance, ability to set tip potential or substrate potential relative to reference electrode and measure tip and substrate current, record tip current as a function of lateral position, sinusoidaly modulate the tip-substrate gap while scanning the tip, and record the phase of the tip current as a function of position. 2.2 The SECM shall include potentiostatic control of the tip and substrate independently with respect to the reference electrodes with a maximum voltage of at least ±10 V, a maximum current of at least 10 mA, and minimum current sensitivity of 1 pA. 2.3 The SECM functions shall be integrated with the AFM function, such that tip (or substrate) current maps can be overlaid over morphological maps, and cyclic voltammetry or approach curves can be collected at selected locations based on the morphological images. 2.4 In SECM mode, the instrument shall provide lateral maps of farradaic current with a spatial resolution comparable to the tip diameter, i.e. 100 nm or better under optimum conditions (for example, with a ferrocene/ferricenium redox couple and a substrate consisting of patterned Au on glassy carbon). 3. The System shall be equipped with Raman spectroscopy meeting or exceeding the following minimum specifications: 3.1 The Raman spectroscopy shall include all of the equipment (i.e., lasers, microscope/optics, spectrometer, detector) necessary to excite, collect, and analyze the scattered radiation. 3.2 The Raman spectrometer and microscope shall be compatible with a wavelength range of 300 nm - 1700 nm without needing change of optics, re-alignment or re-focusing of optics, and therefore reflective optics are required; In order to cover the range over 1100nm, additional detector ports are required for future upgrade to InGaAs array and extended InGaAs detectors. All three detectors shall able to be mounted simultaneously. 3.3 The microscope shall include objectives with magnification of 5×, 10×, 20×, 50×, and 100×, all of which with working distance sufficiently long to be compatible with AFM/SECM. 3.4 The Raman microscope/imaging system shall be capable of confocal and non-confocal far-field operation, with diffraction limited lateral resolution (down to 360nm with 100x NA 0.9 at 532nm under optimum conditions). The confocal aperture must be software controlled and continuously adjustable, with the ability to be adjusted during live data acquisition so as to optimize its size and effect based on read signal. 3.5 The Raman spectrometer shall include at least 2 gratings blazed at 500 nm to provide different combinations of high spectral resolution(0.5 cm-1 /pixel at 532nm with a 1800g/mm grating) at lower range or lower spectral resolution with greater range (up to at least 3000 cm-1, such as with a 300g/m mgrating). For future near UV work, a resolution of about 1cm-1/pixel with 2400g/mm grating is required. The use of gratings higher than 1800g/mm is not desirable for visible and NIR work, due to the loss of reflectivity at high angles. Smilarly the use of gratings higher than 2400g/mm for NUV is not desireable. 3.6 The detector/camera shall be compatible with a spectral range of 200 nm - 1100 nm, be thermo-electrically cooled to -70C or lower, with read-out noise of 3.5e- RMS or lower, dark noise of 0.002e-/pixel/sec or lower, and non-linearity better than 0.5%. 3.7 The system shall include one laser excitation source at 532 nm, with a minimum of 50mW power, low divergence (<1.5mrad), high beam quality (M2 < 1.2) and linewidth better than 30GHz, with the option of additional laser sources at 325 nm (30mW)and 633 nm (17mW) to be added in the future. Provisions for straight-forward addition or replacement excitation sources are required without requiring modifications to the spectrometer. 3.8 The Raman spectrometer shall be seamlessly integrated with AFM and SECM instruments, allowing complete spectra to be collected at desired locations indicated by the AFM, collecting spectral maps over the same regions scanned by AFM (SECM), and collecting spectra as a function of tip or substrate potential. 4.Documentation: 4.1 The system must come with complete documentation, system drawings, and utility connections. Line Item 0002: Installation: The Contractor shall provide installation for the system. Installation, at a minimum, shall include un-crating/un-packaging of all equipment, set-up and hook-up of the system. Installation shall be completed within 30 days following delivery. Line Item 0003: Training: The contractor shall schedule and conduct one (1) training session for NIST personnel on-site @ NIST in Gaithersburg, MD. The training shall provide a thorough demonstration of all equipment functions, maintenance, data administration, and basic troubleshooting. The training may be completed at NIST immediately after installation and demonstration of performance specifications, but no later than 30 days after installation. Warranty: The Contractor shall provide a minimum of a twelve (12) month warranty for the instrumentation. The Contractor shall state the warranty coverage provided for the equipment. Delivery, Installation and Training shall be completed in accordance with the Contractor's commercial delivery schedule. Delivery terms shall be FOB Destination. FOB Destination means: The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver to NIST, Building 301, Shipping and Receiving, Gaithersburg, MD 20899-0001. Evaluation Criteria: Award shall be made to the Contractor whose quote offers the best value to the Government. The Government will evaluate quotations based on the following evaluation criteria: 1) Technical Capability factor "Meeting or Exceeding the Requirement," 2) Past Performance, 3) Experience, and 4) Price. Technical capability, past performance, and experience, when combined, shall be of approximately equal importance to price. If technical capability, past performance, and experience are equivalent, price shall be the determining factor. Past Performance, Experience, and Price shall not be evaluated on quotes that are determined technically unacceptable in accordance with the Technical Capability Evaluation factor. Technical Capability: Evaluation of Technical Capability will be based on the information provided in the quotation. Documentation submitted in the quotation shall be evaluated to determine that the proposed equipment meets or exceeds the Governments minimum required specifications. All equipment must be new. Refurbished and or remanufactured equipment shall not be considered for award. Past Performance: Past Performance will be evaluated to determine the overall quality of the products and services, provided by the Contractor. Evaluation of Past Performance shall be based on the references provided IAW FAR 52.212-1(b)(10) and/or information from other sources, including NIST. Experience: Experience with providing similar equipment shall meet the Government's minimum requirement, but experience with providing the same equipment that this solicitation specifies, will exceed that requirement. Quoters must demonstrate their experience with these systems. Evaluation of experience may be based on contacts used for past performance. Past Performance, Experience and Price shall not be evaluated on quotes that are determined technically unacceptable in accordance with the Technical Capability Evaluation factor. 1352.233-70 AGENCY PROTESTS (APR 2010) (a) An agency protest may be filed with either: (1) the contracting officer, or (2) at a level above the contracting officer, with the appropriate agency Protest Decision Authority. See 64 Fed. Reg. 16,651 (April 6, 1999) (b) Agency protests filed with the Contracting Officer shall be sent to the following address: NIST/ACQUISITION MANAGEMENT DIVISION ATTN: PATRICK STAINES, CONTRACTING OFFICER 100 Bureau Drive, MS 1640 Gaithersburg, MD 20899 (c) Agency protests filed with the agency Protest Decision Authority shall be sent to the following address: NIST/ACQUISITION MANAGEMENT DIVISION ATTN: HEAD OF THE CONTRACTING OFFICE (HCO) 100 Bureau Drive, MS 1640 Gaithersburg, MD 20899 (d) A complete copy of all agency protests, including all attachments, shall be served upon the Contract Law Division of the Office of the General Counsel within one day of filing a protest with either the Contracting Officer or the Protest Decision Authority. (e) Service upon the Contract Law Division shall be made as follows: U.S. Department of Commerce Office of the General Counsel Chief, Contract Law Division Room 5893 Herbert C. Hoover Building 14th Street and Constitution Avenue, N.W. Washington, D.C. 20230. FAX: (202) 482-5858 1352.233-71 GAO AND COURT OF FEDERAL CLAIMS PROTESTS (APR 2010) (a) A protest may be filed with either the Government Accountability Office (GAO) or the Court of Federal Claims unless an agency protest has been filed. (b) A complete copy of all GAO or Court of Federal Claims protests, including all attachments, shall be served upon (i) the Contracting Officer, and (ii) the Contract Law Division of the Office of the General Counsel, within one day of filing a protest with either GAO or the Court of Federal Claims. (c) Service upon the Contract Law Division shall be made as follows: U.S. Department of Commerce Office of the General Counsel Chief, Contract Law Division Room 5893 Herbert C. Hoover Building 14th Street and Constitution Avenue, N.W. Washington, D.C. 20230. FAX: (202) 482-5858 (End of clause) The full text of a FAR provision or clause may be accessed electronically at http://acquisition.gov/comp/far/index.html. The following provisions apply to this acquisition: 52.212-1 Instructions to Offerors-Commercial Items; 52.212-3 Offerors Representations and Certifications- Commercial Items. Offerors shall complete annual representations and certifications on-line at http://orca.bpn.gov in accordance with FAR 52.212-3 Offerors Representations and Certifications- Commercial Items. If paragraph (j) of the provision is applicable, a written submission is required. The following clauses apply to this acquisition: 52.212-4 Contract Terms and Conditions-Commercial Items; 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders-Commercial Items including subparagraphs: 52.203-6, Restrictions on Subcontractor Sales to the Government, with Alternate I; 52.219-4, Notice of Price Evaluation Preference for HUBZone Small Business Concerns (if the offeror elects to waive the preference, it shall so indicate in its offer); 52.219-8, Utilization of Small Business Concerns; 52.222-3, Convict Labor; 52.222-19 Child Labor - Cooperation With Authorities And Remedies; 52.222-21, Prohibition of Segregated Facilities; 52-222-26, Equal Opportunity; 52.222-35, Equal Opportunity for Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; 52.222-36, Affirmative Action for Workers with Disabilities; 52.222-37, Employment Reports on Special Disabled Veterans, Veterans of the Vietnam Era, and Other Eligible Veterans; 52.222-39, Notification of Employee Rights Concerning Payment of Union Dues or Feeds (Dec 2004) (E.O. 13201); 52.225-5, Trade Agreements 52.225-13 Restriction on Certain Foreign Purchases; 52.232-33, Payment by Electronic Funds Transfer-Central Contractor Registration. Department of Commerce Agency-Level Protest Procedures Level above the Contracting Officer is also incorporated. It can be downloaded at www.nist.gov/admin/od/contract/agency.htm. All quoters shall submit the following: 1) An original and one (1) copy of a quotation which addresses all line items; 2) For the purpose of evaluating technical capability: Technical description and/or product literature which clearly details the manufacturer, make and model of the proposed product(s), addressed all required specifications, and clearly documents that the offered product(s) meet(s) or exceeds the specifications stated herein. 3) For the purpose of evaluation of past performance: A list of at least three (3) references to whom the same or similar equipment has been provided. The list of references shall include, at a minimum: The name of the reference contact person and the company or organization; the telephone number of the reference contact person; the contract or grant number; the amount of the contract and the address and the telephone number of the Contracting Officer if applicable; the date of delivery or the date services were completed and a description of the equipment sold to each reference; 4) For the purpose of evaluation of experience: Information which demonstrates the quoter's experience in manufacturing equipment that is the same or similar to the Governments requirement. Information which documents the history of the product the quoter is proposing in the marketplace, including, but not limited to, the length of time the product has been commercially available in the marketplace, and the number of customers to whom the product has been delivered. 5) Description of commercial warranty; 6) A current copy of the Contractor's price list or catalog pages that contain pricing for the equipment/services defined within the Contractor's quotation. 7) This is an Open-Market Combined Synopsis/Solicitation for equipment as defined herein. The Government intends to award a Purchase Order as a result of this Combined Synopsis/Solicitation that will include the terms and conditions that are set forth herein. In order to facilitate the award process, ALL quotes shall include a statement regarding the terms and conditions herein as follows: The offeror shall state "The terms and conditions in the solicitation are acceptable to be included in the award document without modification, deletion, or addition." OR The offeror shall state "The terms and conditions in the solicitation are acceptable to be included in the award document with the exception, deletion, or addition of the following: Offeror shall list exception(s) and rationale for the exception(s) Please note that this procurement is not being conducted under the GSA Federal Supply Schedule (FSS) program or another Government-Wide Area Contract (GWAC). If an offeror submits a quotation based upon an FSS or GWAC contract, the Government will accept the quoted price. However, the terms and conditions stated herein will be included in any resultant Purchase Order, not the terms and conditions of the offeror's FSS or GWAC contract, and the statement required above shall be included in the quotation. All quotes shall be received not later than 3:00 PM local time, on July 23, 2010 at the National Institute of Standards & Technology, Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, MD 20899-1640, Attn: Joni Laster. Any questions or concerns regarding this solicitation should be forwarded in writing via e-mail to the Contract Specialist (Joni Laster) @ joni.laster@nist.gov. E-mailed quotes are acceptable and shall be addressed to: joni.laster@nist.gov. Faxed quotes will NOT be accepted. Offerors' quotations shall not be deemed received by the Government until the quotation is entered into the e-mail address inbox set forth above.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB1341-10-RQ-0462/listing.html)
- Place of Performance
- Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02200028-W 20100710/100708235517-0303b14a84bddf0efe54d959aace0788 (fbodaily.com)
- Source
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FedBizOpps Link to This Notice
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