MODIFICATION
66 -- RECOVERY - FOCUSED ION BEAM / SCANNING ELECTRON MICROSCOPY MICROSCOPE
- Notice Date
- 2/19/2010
- Notice Type
- Modification/Amendment
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SB1341-10-RQ-0066
- Archive Date
- 3/13/2010
- Point of Contact
- Eduardo F. Baca, Support Contractor, Phone: 3019756388, Joseph L. Widdup, Phone: (301) 975-6324
- E-Mail Address
-
eduardo.baca@nist.gov, joseph.widdup@nist.gov
(eduardo.baca@nist.gov, joseph.widdup@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- The purpose of this amendment is to affect the following change: At Page 5, replace specification 5.b) language "Built-in strain gauge, with the ability to digitize the data" with new language "The built-in strain gauge, must have the capability to digitize the data and digitally record loads of.1 milligrams to 6 milligrams or an equivalent force of 10 micor- Newtons to 600 micro-Newtons." All other terms and conditions remain unchanged and in full force and effect.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SB1341-10-RQ-0066/listing.html)
- Record
- SN02070068-W 20100221/100219235622-df87669d85e5cb29397ccccad2caf0ed (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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