FBO#3004
66 - Instruments and Laboratory Equipment
MODIFICATIONS - February 14, 2010
- SB1341-10-RQ-0038 - Modification/Amendment
RECOVERY: DUAL-BEAM SCANNING ELECTRON MICROSCOPE AND FOCUSED ION BEAM SYSTEM
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- SB1341-10-RQ-0035 - Modification/Amendment
RECOVERY: ULTRA HIGH RESOLUTION FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE SYSTEM
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- SB1341-10-RQ-5003 - Modification/Amendment
RECOVERY - ATOMIC FORCE MICROSCOPE - COMBINED SYNOPSIS SOLICITATION
Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division
- FA4877-10-Q-0310 - Modification/Amendment
JUSTIFICATION FOR SOLE SOURCE
Department of the Air Force, Air Combat Command, 355 CONS
- N68335-08-G-0016 - Modification/Amendment
CASS CIRCUIT CARDS AND MISC ITEMS
Department of the Navy, Naval Air Systems Command, Naval Air Warfare Center Aircraft Division Lakehurst
- 159315 - Modification/Amendment
REQUEST FOR PROPOSAL FOR A 3 GEV BOOSTER FOR THE NATIONAL SYNCHROTRON LIGHT SOURCE II (NSLS II)
Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven
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