MODIFICATION
66 -- EXPERT PARTICLE ANALYSIS SYSTEM
- Notice Date
- 10/27/2009
- Notice Type
- Modification/Amendment
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Cincinnati Procurement Operations Division 26 W. Martin Luther King Drive Cincinnati, OH 45268
- ZIP Code
- 45268
- Solicitation Number
- PR-CI-10-10068
- Response Due
- 11/16/2009
- Archive Date
- 12/16/2009
- Point of Contact
- WILLIAM M. YATES, Contract Specialist, Phone: 513-487-2055, E-Mail: yates.william@epa.gov
- E-Mail Address
-
WILLIAM M. YATES
(yates.william@epa.gov)
- Small Business Set-Aside
- N/A
- Description
- In accordance with FAR Part 13, Simplified Acquisition Procedures, and FAR Part 12 Commercial Items, the U.S. Environmental Protection Agency (EPA) intends to purchase an Expert Particle Analysis System under a fixed priced effort for the National Exposure Research Laboratory in Research Triangle Park, NC, on a sole source basis. This system will be used for the quantitative analysis of air particulate samples in support of air pollution research, source apportionment, and human exposure programs. A. MINIMUM GENERAL SPECIFICATIONS: The Expert Particle Analysis System comprises a high-resolution field-emission scanning electron microscope (FE-SEM) coupled with a state-of ?the-art energy-dispersive xray spectrometer (EDS) and advanced software and analytical tools customized for the EPA to facilitate manual and computer controlled SEM (CCSEM) data acquisition and data analysis of environmental samples. The EPAS system will provide size, shape, images, and elemental composition for particles ranging in size from millimeters down to tens of nanometers. Data obtained from the EPAS will be applied in source apportionment studies, ambient air monitoring, human exposure and health effects research, nanomaterials research, and other environmental studies. INSTRUMENT PLATFORM: Type -The SEM must be a Field-Emission SEM Resolution - Better than 2 nm resolution in high resolution mode Stage - 5 axis semi-compucentric stage, with motorized x, y motions of at least 80 mm x 60 mm, with x and y axis stage movement tolerance of +/- 0.25 microns, and with position repeatability at +/- 1 micron EDS system - Vibration free, maintenance free, Peltier-cooled 30mm2 silicon drift detector (SDD), Energy resolution <133eV (Mn Ka, 0 to 100,000 cps) Sample Capacity - Ability to load at least 20, half-inch sample stubs into the chamber at one time. SOFTWARE FOR AUTOMATED DATA COLLECTION CCSEM Templates - Automated acquisition procedures provided for: 1. Particle size only analysis, 2. Particle size and elemental chemistry analysis by EDS, 3. Particle size, elemental chemistry, and microimage analysis. Microimaging in Automated Mode - Ability to collect microimages with enhanced pixel resolution (as opposed to electronic zoom at fixed pixel resolution) of individual particles in automated analysis mode with choice of backscattered electron (BE) signal or secondary electron (SE) signal. DATA PROCESSING AND INTERPRETATION Software Compatibilty - Data must be compatible with RJLG Expert Particle Analysis software. Data Processing Features - Standard methods and criteria for calculation of particle attributes, such as ASTM 1877 and standardless spectrum quantification. Ability to define, via expressions and light scripting, custom-derived particle attributes from data elements available in standard methods. Ability to create multiple particle data sets through parameterized methods, (i.e. varing sets of chemical elements in the quantifications and classifications) without having to re-acquire the data. Ability to calculate ambient particle mass and elemental concentrations (ug/m3) for passive aerosol samples based on individual particle data using demonstrated procedures. Ability to compensate for EDS background from sample substrate, e.g., carbon stripping, while accounting for particle size. Ability to create Ad-Hoc Data Summarizations. Ability to create analysis project templates, and reuse settings which include particle attribute calculations, custom attributes classification methods and summaries. Additional Specifications General Requirements Warranties: One year warranty on all components of the EPAS.Software: EPAS software updates at no charge for up to one year after contract award.Training: The Contractor shall provide on-site training for (1) the FE-SEM instrument, (2) the EDS system, and (3) advanced applications. The North American Industry Classification Code (NAICS) is 334516. THIS NOTICE OF INTENT is not a request for competitive proposals. No solicitation document is available. However, interested parties may identify their interest and capability of meeting EPA requirements by submitting technical and cost documentation to William M Yates, Contracting Officer, by e-mail yates.william@epa.gov. The documentation provided must establish that all the requirements can be meet by your submission. The solicitation release date is anticipated to be November 16, 2009. Anticipated award date is December 15, 2009. A determination not to compete the proposed requirement based upon responses to this notice is solely within the discretion of the Government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement or to proceed on a sole source basis. Point of Contact for this requirement is William M Yates, Contracting Officer, at (513) 487-2055, or via e-mail at yates.william@epa.gov. Questions must be submitted in writing to William M Yates via e-mail. Telephone queries will not be honored.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/EPA/OAM/OH/PR-CI-10-10068/listing.html)
- Place of Performance
- Address: US EPA National Exposure Research Lab 109 T.W. Alexander Drive, M/C E205-01 Durham, NC
- Zip Code: 27711
- Zip Code: 27711
- Record
- SN01992912-W 20091029/091027234945-a522c9d20b90ba4b2bd2aff70a452a23 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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