SOLICITATION NOTICE
66 -- 3D OPTICAL MEASUREMENT INSTRUMENT
- Notice Date
- 6/18/2007
- Notice Type
- Solicitation Notice
- NAICS
- 334513
— Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables
- Contracting Office
- NASA/Glenn Research Center, 21000 Brookpark Road, Cleveland, OH 44135
- ZIP Code
- 44135
- Solicitation Number
- NNC07ZRX021Q
- Response Due
- 7/4/2007
- Archive Date
- 6/18/2008
- Small Business Set-Aside
- N/A
- Description
- NASA/GRC has a requirement for a 3D Optical Measurement Instrument. The specifications are in the Statement of Work included in this solicitation. This notice is a combined synopsis/solicitation for commercial item(s) prepared in accordance with the format in FAR part 12, as supplemented with additional information included in this notice. This procurement is being conducted under the Simplified Acquisition Procedures (SAP) set forth in FAR Part 13. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. This notice is being issued as a Request for Quote (RFQ) for 3D Optical Measurement Instrument. Statement of Work follows: Statement of Work - NASA 3D Optical Measurement Instrument Specifications PRINCIPLE Instrument shall allow measurements which are non-contacting, optical, 3 dimensional, based on focus variation. The operating principle focus variation has been added to the latest ISO standard for classifying surface texture methods. The new ISO Norm 25178 for the first time includes standardized parameters to classify optically area based measurements. USE The instrument shall be able to be used in both laboratory and production environments. The instrument shall be operable using non-skilled technicians where required. Automation of functions and analysis can also be added to make the instrument useable for the majority of surface metrology and inspection requirements NEED Materials Science and Failure Analysis Conventional microscopy inspects the surface optically with light microscopes and is limited by the microscope?s depth of focus. Quantitative surface information shall be obtained by a separate 3D surface analysis instrument. Since specimens in material development often contain fractured surfaces with steep flanks or rough surface topography, NASA requires a solution to digitally measure and inspect the entire surface. The analysis of the optical appearance of the surface coupled with the topographic data shall be directly correlated to the reconstructed 3D color image. Fatigue fracture analysis and material deformation at ductile fracture zones shall be easily quantified through volumetric, area, or profile measurements directly on the true color image. REQUIRED An optical 3D measurement instrument. This instrument shall provide for roughness assessments, quality assurance, and inspection of surfaces. The range shall be extended over centimeters to nanometers. It shall provide all functionalities for dimensional measurements, surface analysis and characterization. Geometries with steep flanks, highly reflective properties and strong roughness shall be measurable with a vertical resolution up to 10 nanometers, with a specific requirement of 50 nanometer resolution with 20 millimeters of working distance, making the instrument ideal for surface study of both homogeneous and compound materials. 3D measurements shall be performed directly in the optical image. The resulting image shall possess full depth of focus, and be able to provide 3D surface measurement in true and false color. SPECIFIC FEATURE REQUIREMENTS Automation via scripting. The 3D measurement instrument shall acquire images of the sample and process them using a computer which shall be included as part of the system. The computer acquisition and control system shall be operated use simple syntax similar to Java Script to easily adapt the system to specific needs. Resulting analysis modules shall be operable by semi skilled staff. Automatic surface defects analysis is one example how scripting can be used. Depths and valleys as well as cracks, holes and other features shall be scanned, measured, and quantified automatically. 2D Image Analysis The 2D image analysis shall allow the performance of manual and semi automatic measurement of simple features. Also, the ability to write on the images as well as saving measurement results in a comprehensive and easy to use database shall be provided: ? Manual measurement of lines, parallel lines, arcs, circles, ellipses, polygons, polylines, free hand, marker ? Automatic measurement of lines, parallel lines, circles, arcs ? Statistical calculation of results such as mean, standard deviation, minimum, maximum, median ? Automatic search of equally shaped structures on the image Volume Analysis Volume analyses shall calculate the volumes of voids and protrusions. The measurement area shall be defined directly on the optical color image. For the 3D-boundary of the selected area NASA requires the calculation based on accepted models covering surface that behaves like a soap film: ? Selectable area for volume measurement ? Selectable reference surface (plane, minimum spanning surface, top and bottom cover) ? Automatic calculation of reference plane from 3D points Form Analysis In addition to common surface analysis and characterization, the optical measurement instrument shall measure complex geometries of components. This shall include the alignment of references, and measurement of surface features such as angles, radii etc. The optical measurement instrument shall also provide the ability to measure and align more complex surface features such as rods, cylinders, and spheres. The instrument shall include a fully integrated programmable indexable rotary fixture to rotate cylindrical samples. Rotation and indexing of the fixture shall be controlled by the automated measurement software. This rotary unit shall have a repeatability of rotation equal or better than 400 micro-radians, planarity equal or better than 20 microns, and control resolution of equal or better than 0.01 degrees. ? Automatic measurement of lines, parallel lines, height steps, double height steps and ISO 5435 conform height steps, angles, 2-line-angles, circles and normal distance ? Measurement of roundness, evenness and alignment of spheres ? Measurement of cylindrical forms over full 360 degrees of rotation. Area Analysis Area analysis shall provide comprehensive and significant measurements to classify the roughness of a surface. Also, analysis shall include information about gradient and spectral distribution. The ROI (region of interest) is selected directly in the optical color image and measurements shall be yielded fast, fully automatically, and robustly. For the visual representation of the surface a grey scale or pseudo colored depth map shall be available: ? Analysis of height-distribution ? Calculation of area material ratio ? Measurement of spatial parameters with auto correlation function, Fourier spectrum and miscellaneous parameters ? Gradient distribution ? Calculation of bearing ratio curve and bearing area curve ? Calculation of fractal dimension ? Filtering of profiles Profile Analysis Profile measurement enables the virtual cutting of a specimen. The user defines a path on the optical color image and receives the corresponding 3D profile. Roughness and contour measurements conform to recognized international EN ISO standards. The profile analysis shall also allow the fitting of features such as circles, angles, notches, or rectangles on flat or cylindrical surfaces. The optical measurement instrument shall provide further, manual and semi automatic measurement possibilities: ? Profile extraction with different width ? Filtering of the profile with selectable Lc values with ISO 4288 conformity ? Manual cursor measurement ? Roughness and waviness parameter calculations according to ISO 4287 and ISO 11562 ? Calculation of Fourier spectrum of profiles and bearing ratio curve ? Calculation of statistical parameters of profiles ? Calculation of mean and standard deviation of profiles Off-Line Analysis The system shall provide independent desktop computer software and the associated keys or dongles so that two independent desktop computers will be able to perform the full analysis and viewing of 3D and 2D data sets/images produced with the agreed upon instrument. The desktop software shall be able to import Z Axis image stacks from any optical microscope or vision system and produce compatible images with 3D data and fully extended depth of focus and sharp images. Reflective geometries Different surface compositions and strong topographies can produce strong reflections, interreflections, and under-reflected properties. The optical measurement instrument shall provide failure analysis and fractography uses to effectively capture spectral variation between over-illuminated and under-illuminated surfaces in a radiometrically-balanced image. Results need to be well exposed in all specular areas and also contain accurate topographic data sets. Rough surfaces The complex reflective properties of extremely sculptured surfaces can be extremely difficult to resolve and capture with conventional optical systems. The 3D measurement instrument shall be able to easily quantify rough surfaces with the accurate measurement of Ra, Rq and Rz including bearing ratio curve. Measurement of roughness, waviness and contour must conform to recognized international ISO standards. Registered true color information NASA requires a 3D measurement instrument that simultaneously captures the entire surface topographic information in combination with its true color information. Both the topographic and color information shall be registered to the 3D data file. 3D measurements shall be able to be performed directly on the optical color image. Steep sided flanks Surfaces often contain steep flanks and vertical edges. These structures are difficult to measure using conventional optical methods. The 3D instrument shall be able to perform dense and robust measurements up to 88?. Features several millimeters deep shall be robustly and traceably captured. Measurement results shall have the ability to be reproduced with a vertical resolution of up to 10nm; A minimum of 50 nanometer resolution shall be provided with a working distance of 20 millimeters between the sample and the objective. NASA In-House Self Calibration The 3D optical system shall be delivered with a traceable calibration standard. Both, the lateral and vertical part of the standard shall be calibrated by national laboratories. The calibration shall also trace back to NIST (National Institute of Standards and Technology, USA) and the PTB (Physikalisch Technische Bundesanstalt, Germany). The certified calibration standard shall be usable to calibrate the system with either NASA in-house calibration services, and/or manufacturer provided A2LA/ A-Class calibration services. Analysis and Inspection Sample Capabilities The agreed upon system shall be able to measure parts up to 100 millimeters (mm) in height. The agreed upon system shall be able to measure parts up to 88 degrees maximum slope, vertical angle. The agreed upon system shall be have stage capacity able to accommodate 18 kilograms of weight, including the test sample and any added fixtures. The agreed upon system shall be able to measure and seamlessly stitch 3D and 2D Images and DataSets up to 100 mm x 100 mm in the X,Y axis. The agreed upon system shall be able to measure samples without any sample preparation. The agreed upon system shall be able to accommodate rectangular or cylindrical parts up to 250 mm in length and 40 mm in diameter, and be able to examine and measure roughness/features of a band in the middle of the reduced section that is 13 mm long by 360 degrees in rotation. Service All necessary service, software updates, and technical consulting shall be provided for a period of 4 additional years. Deliverables: 1. 3D Optical measurement instrument including x, y, z, and rotating stage control 2. Fully integrated computer for instrument control, image acquisition, and image processing 3. Software and license: for the above instrument control computer and for two independent desktop computers 4. Manual for instrument, all attachments, and software 5. Delivery shall be FOB Destination to NASA Glenn Research Center, 21000 Brookpark Road, Cleveland Oh 44135. 6. Installation shall be at NASA Glenn Research Center, 21000 Brookpark Rd, Cleveland, OH 44135, Building 49 Room TBD. Offers for the item(s) described above are due by July 4, 2007, 4:30p.m. GRC local time and may be mailed to NASA Glenn Research Center, 21000 Brookpark Road, MS 500-305, Cleveland, OH 44135, and include, solicitation number, FOB destination to this Center, proposed delivery schedule, discount/payment terms, warranty duration (if applicable), Cage Code, taxpayer identification number (TIN) and other Representations and Certifications (52.212-3), identification of any special commercial terms, description of items offered per FAR 52.212-1-Instructions to Offerors-Commercial Items and as modified, and be signed by an authorized company representative. A copy of a published price list, catalog price or computer page printout showing the price for requested items may also be included if desired. (Note, the Contracting Officer may request this information if only 1 source provides a proposal). Offerors are encouraged to use the Standard Form 1449, Solicitation/Contract/Order for Commercial Items form. This form may be obtained via the internet at URL: Informed : ftp://ftp.hq.nasa.gov/forms/form/sf1449.itp PDF : ftp://ftp.hq.nasa.gov/forms/pdf/sf1449.pdf Faxed offers are not acceptable due to the required information of 52.212-1. Offerors shall provide the information required by FAR 52.212-1 as amended and the following: 52.212-1 (b) amendment: All offerors shall include full and complete product specifications including technical specifications on all components. Offerors shall also include a list of at least three (3) recent sales of identical or similar equipment, including contact information for the customer, so the Government can verify past performance. If the end product(s) quoted is other than domestic end product(s) as defined in the clause entitled "Buy American Act -- Supplies," the Offerors shall so state and shall list the country of origin. Offerors must provide a completed copy of 52.212-3, Offeror Representation and Certifications - Commercial Items with their quote. FAR 52.2l2-3 may be obtained via the internet at URL: http://www.grc.nasa.gov/WWW/Procure/rforms.html FAR 52.212-4 (Feb 2002), Contract Terms and Conditions-Commercial Items is applicable. FAR 52.212-5 (Apr 2003), Contract Terms and Conditions Required to Implement Statutes or Executive Orders-Commercial Items is applicable. The FAR may be obtained via the Internet at URL: http://www.hq.nasa.gov/office/procurement/regs/nfstoc.htm Questions regarding this acquisition must be submitted in writing no later than June 25, 2007. Telephone questions will NOT be accepted. Prospective quoters shall notify this office of their intent to submit a quotation. Ombudsman has been appointed -- See NASA Specific Note "B". It is the offeror's responsibility to monitor the following Internet site for the release of solicitation amendments (if any) and for downloading their own copy of this combination synopsis/solicitation and amendments http://nais.msfc.nasa.gov/cgi-bin/EPS/bizops.cgi?gr=C&pin=22 Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html Any referenced notes may be viewed at the following URLs link below.
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