SOURCES SOUGHT
66 -- Transmission Electron Microscope
- Notice Date
- 4/20/2007
- Notice Type
- Sources Sought
- NAICS
- 334519
— Other Measuring and Controlling Device Manufacturing
- Contracting Office
- RDECOM Acquisition Center - Adelphi, ATTN: AMSRD-ACC, 2800 Powder Mill Road, Adelphi, MD 20783-1197
- ZIP Code
- 20783-1197
- Solicitation Number
- W911QX07R0015
- Response Due
- 5/7/2007
- Archive Date
- 7/6/2007
- Small Business Set-Aside
- N/A
- Description
- The Army Research Laboratory, Aberdeen Proving Ground, MD requires a commercially available 200 kV Field Emission Transmission Electron Microscope (TEM). The methods required for morphological analysis include scanning TEM (STEM), high-angle annular dark-field (HAADF) STEM, electron energy loss spectroscopy (EELS), energy-filtered TEM (EFTEM), energy dispersive spectroscopy (EDS), electron diffraction, and tomography. The instrument must be fully equipped for the characterization of radiation sensit ive samples, must be capable of collecting all data digitally, and must be capable of remote operation and data sharing. Some of the applicable specifications are as follows: Illumination System: Accelerating voltages must range from 80 kV to 200 kV inclusive, with a stability of 1 ppm/min (RMS) or better. Specimen Stage: A 5-axis, fully motorized eucentric side-entry goniometer stage with full computer control shall be supp lied. Stage drift shall be less than 0.5 nm/min, achievable in no more than 5 minutes after specimen movement. The goniometer must be capable of stage motion of 0.04 nm/step or less, with a total range in X and Y of ? 0.6 ?m, and with stage drift of 0.2 nm/min or less (may include use of software for drift correction). Objective Lens: The objective lens pole piece shall have guaranteed resolution equal to or better than 0.23 nm (first zero at Scherzer defocus), an information limit of 0.15 nm, a spheric al aberration coefficient not more than 1.0 mm, a chromatic aberration coefficient not more than 1.4 mm and full analytical capability with a EDS detector solid angle of 0.13 sr (30 mm2 detector) or 0.28 sr (50 mm2 detector) and a takeoff angle of 25?. Im age Formation: Off-axis chromatic aberration shall be automatically corrected. A low-magnification mode is required. Electron diffraction capability shall be provided in selected area diffraction (SAD), high-dispersion diffraction (HDD), and convergent beam electron diffraction (CBED) modes. CBED must have a convergence angle of 20 mrad or more with an acceptance angle of at least ? 10?. Radial image distortion should be less than 1.5%; spiral distortion shall not exceed 1.0%. Control and Display Syst em: The instrument must be controlled through a graphical user interface (GUI) -based software package that allows the operator to access and use all operations of the instrument other than insertion of the sample. Remote Instrument Operation: Complete operation of the instrument, identical to on-site operation, from any remote location via a national or international network must be provided. Vacuum System: The system shall provide a working pressure of 6 x 10-6 Pa or lower at the specimen position. T he partial pressures of hydrocarbons and water vapor at the specimen position shall not exceed 4 x 10-8 Pa and 4 x 10-6 Pa respectively. The gun pressure must be 3 x 10 8 Pa or lower. The vacuum at the specimen position should return to operating range w ithin 15 seconds of sample insertion. Anti-Contamination Device (ACD): An ACD shall be provided for the specimen area to effectively trap contaminants from all directions. Use of the ACD shall not limit operation or performance in microanalysis, micro-d iffraction, CBED or specimen tilt. The ACD must be provided shall prevent the formation of ice on the specimen for a minimum of 16 hours during observation of samples at liquid nitrogen (LN2) temperatures. STEM: An integrated, completely digital scannin g system for STEM bright-field and dark-field imaging, STEM mapping, backscattered electron imaging, secondary electron imaging and vector mode analysis must be provided. STEM must include image scan, line scan and spot scan modes. STEM resolution shall meet or exceed 0.16 nm in HAADF mode, and 1.0 nm or better in SEI and BEI modes. A Hard X-ray aperture, placed just above the objective lens, shall be provided. High-Angle Annular Dark Field Capability: HAADF capability must be provid ed with a YAP detector mounted post-column. Electron Energy Loss Spectroscopy: A 3rd-order spectrometer with post-column energy filtering and with a multi-port, high-speed, high-resolution (2K x 2K pixels) CCD for capture of EELS and energy filtered TEM (EF-TEM) data must be included. The isochromaticity over the entire EF-TEM field-of-view shall not exceed 1.25 eV. Digital imaging: Routine imaging shall be accomplished via a retractable, CCD-type digital camera mounted post-column, with a minimum resol ution of 11 megapixels. Electron Dispersive Spectroscopy: Full EDS capability must be provided. The EDS detector should be a 30 mm2 (or larger) Si(Li) detector with a resolution of 136 eV (Mn K? peak at FWHM). The EDS spectrometer shall provide hole co unt of 1500 or better, film count of 19 or better, and peak-to-background ratio of 4000 or better (NiOx film on C on a Mo grid, Egerton test specifications, 0.5 nA of current for a 1 nm diameter probe). Cryotransfer System: A system for loading and exami ning samples that must be maintained at temperatures no greater than -165 ?C must be included, with tools for frost-free transfer of no fewer than 4 specimen grids, and all other necessary accessories. Specimen Holders: A range of specimen holders, all u sing a double o-ring differential pre-pumping vacuum mechanism to protect column vacuum, are required. Specimens for tomography must be automatically aligned in the tomography sample holder upon loading. Automated Electron Tomography System: A fully aut omated, computer controlled system for collecting tomography data shall be provided. The tomography system shall be compatible with the minimum dose system. Warranty: Warranty of one full year covering all labor and non-consumable parts. During the war ranty period, the contractor shall assume responsibility for any and all defects in materials, workmanship and performance. The contractor shall perform two semiannual preventive maintenance inspections of the equipment for cleaning and adjustment of all instrument components as necessary. Emergency service shall be provided as needed. Training: The contractor shall provide training at Aberdeen Proving Ground, MD, to thoroughly familiarize two operators with the proper operation and routine care of the instrument after all performance guarantees have been demonstrated as per contracted specifications. This synopsis is published for the purpose of notifying and identifying qualified sources and shall not be construed as a request for competitive proposals. Responses from interested sources are due by 7 May 2007. The NAICS code for this acquisition is 3 34519 and the size standard is 500 employees. The Government will consider a small business or other set-aside based on responses received. Solicitation W911QX-07-R-0015 will be issued on the Army Single Face to Industry internet site on or about 10 May 2007. Responses to this synopsis should be sent to Robert Tomko at email address: rtomko@arl.army.mil.
- Place of Performance
- Address: RDECOM Acquisition Center - Adelphi ATTN: AMSRD-ACC, 2800 Powder Mill Road Adelphi MD
- Zip Code: 20783-1197
- Country: US
- Zip Code: 20783-1197
- Record
- SN01278066-W 20070422/070420221151 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |