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FBO DAILY ISSUE OF NOVEMBER 25, 2005 FBO #1460
SOURCES SOUGHT

66 -- UHV Four-Point Nano-Probing System

Notice Date
11/23/2005
 
Notice Type
Sources Sought
 
NAICS
339111 — Laboratory Apparatus and Furniture Manufacturing
 
Contracting Office
Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
 
ZIP Code
11973
 
Solicitation Number
RFPNP104456
 
Response Due
1/5/2006
 
Archive Date
1/20/2006
 
Description
This is a combined synopsis/solicitation. This solicitation is being issued as a Request for Proposals (RFP) for an UHV probing system designed for the high accuracy positioning of four independent probing tips to establish well-defined local electrical contacts on the surface of nanostructured samples for the purpose of electrical transport measurements. At the heart of the instrument is a nanoprobing stage designed to permit coarse and fine movement of each of the probe tips in three spatial dimensions (x, y, z), which allows coarse movement of the sample in a plane (x, y), and which can also be moved as a whole (i.e., with both tips and sample) in the (x, y) plane. To monitor the tip and sample movements in real time and at the appropriate length scales (millimeters to nanometers) and thus enable controlled tip navigation, a high-resolution FE-SEM imaging system designed for and operating under true UHV conditions shall be integrated with the Nanoprobe. Combined with an electron spectrometer, the FE-SEM shall also be capable to perform local Auger electron spectroscopy (AES) and high resolution scanning Auger microscopy (SAM) on samples mounted on the Nanoprobe stage. The Nanoprobe shall be operable over a wide temperature range, with focus on low temperatures to minimize thermal noise in transport measurements. At least one of the four probe tips shall be operable as a scanning probe, capable of acquiring scanning tunneling microscopy (STM) images and of performing basic scanning tunneling spectroscopy. This acquisition is planned as a ?Best Value? procurement. The utilization of this procedure is expected to provide the greatest overall benefit to BSA/BNL. ?Best Value? employs a trade off process that permits award to other than the lowest priced offeror or to the highest technically rated offeror. The tradeoff process, associated with Best Value involves a comparative weighing of the evaluation factors and sub-factors identified in the Request for Proposals (RFP). Specifically, the trade off process involves selecting the most advantageous offer based upon an integrated assessment of both non-cost/price factors, taken in their assigned relative importance. The following factors, in their relative order of weighting, will be utilized to evaluate the offers: - General Technical Specifications: Operating specifications for the proposed UHV Nanoprobe system utilizing the same format (Section and Sub-Section numbering) presented by the specifications contained in the solicitation. - Performance Risk: References, points of contact and telephone numbers for all installations of UHV Nanoprobe or similar systems for the last 3 years. - Upgradeability: Operating specifications and availability of an UHV Nanoprobe configured to accept future upgrades to include nano stenciling capabilities. Proposals are due January 4, 2005 by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail This RFP has been sent to the following known manufacturers: Omicron - NanoTechnology GmbH Limburger Str. 75 65232 Taunusstein Tel: 06128/987-0 email: info@omicron.de RHK Technology, Inc. 1050 East Maple Road Troy, MI 48083 USA | tel: 248-577-5426 email: info@rhk-tech.com All other interested manufacturers may download the complete RFP from this site.
 
Place of Performance
Address: Bookhaven National Laboratories, Upton, NY
Zip Code: 11973
Country: USA
 
Record
SN00936868-W 20051125/051123211656 (fbodaily.com)
 
Source
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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