SOLICITATION NOTICE
66 -- FORM TALYSURF PGI PLUS MEASURING MACHINE
- Notice Date
- 9/26/2003
- Notice Type
- Solicitation Notice
- Contracting Office
- NASA/George C. Marshall Space Flight Center, Procurement Office, Marshall Space Flight Center, AL 35812
- ZIP Code
- 35812
- Solicitation Number
- 8-4200019350
- Response Due
- 10/10/2003
- Archive Date
- 9/26/2004
- Point of Contact
- Gloria J. Coffey, Contract Specialist, Phone (256) 544-9187, Fax (256) 544-6041, Email gloria.coffey@msfc.nasa.gov - Amy B. Campbell, Contracting Officer, Phone (256) 544-8620, Fax (256) 544-9081, Email Amy.Campbell@msfc.nasa.gov
- E-Mail Address
-
Email your questions to Gloria J. Coffey
(gloria.coffey@msfc.nasa.gov)
- Description
- NASA/MSFC has a requirement for 1 each Form TalySurf Plus Measuring Machine (or equivalent). Minimum Requirements For Stylus Profilometer for Surface Texture and Contour Measurement General: The instrument must be able to measure the surface texture and contour of machined parts ranging from rocket engine tribological components to optical surfaces. Common rocket engine components include highly polished ceramic ball bearings, precision ground steel bearing rings, lapped gears, shot-peened turbine blades, injector nozzles, and high pressure mechanical seals. Optical surfaces include polished quartz flats, replicated grazing incidence X-ray optics, and super polished conical mandrels. The components being measured will include interior and exterior surfaces. The instrument must be able to measure three dimensional surface profile in addition to more common two dimensional surface profile. The ability to measure a wide range of contour while still being able resolve fine roughness detail is essential. This procurement will replace an existing stylus tracing type instrument, a Taylor-Hobson Form Talysurf 120L, circa 1990, with 3-D option (also known as an automatic Y-axis table). The existing instrument no longer meets our technical requirements in the following areas: vertical resolution, vertical range, horizontal straightness, traversing length, automatic Y-axis table travel, automatic Y-axis load capacity, slow computing speed and limited DOS based computer control, data acquisition, analysis and reporting. The new instrument will be a turn key system and all accessories must be compatible with the basic instrument. For help in evaluating candidate instruments and their existing specifications, the following conventions are typically followed for describing such a profile tracing instrument: the tracing direction as the X-axis; the movement of the work piece table to reposition the part for a parallel trace as the Y-axis; and the vertical motion of the stylus as the Z-axis. Gage requirements: Vertical range and resolution, roughness: 10 millimeters @ 1 nanometer Vertical range and resolution, contour: 30 millimeters @ 3 nanometer Horizontal straightness: 100 nanometers per 100 millimeters travel Traversing Length: 200 millimeters Calibration: arcuate method using ball or hemisphere. Ball or hemisphere must be traceable to a national standard. Work Piece Capacities: Automatic Y-axis table: 100 millimeter travel, 1 micrometer steps, 20 kg load capacity Without automatic or manual Y-axis table: 100 kg weight, 500 mm height Computer and Operating System Software: PC compatible computer control and data analysis with Windows based software. Provide for the exporting of profile data sets for use in external plotting programs or spreadsheet software. Provide paper copy of profile trace Provide means of exporting modified profile plot to Windows word processing or desktop publishing programs for report writing. Allow for multitasking such that the instrument can be making a 3-D measurement in the background, while a previously made measurement can be analysed in the foreground. Surface Texture and Contour Analysis Software The software shall calculate two dimensional surface texture parameters that conform to recognized standards such as ANSI/ASME B46.1 and ISO 4287. Similar three-dimensional (3-D) parameters should also be included, however, since no standard for 3-D parameters exists such as for 2-D, the software should describe how the 3-D parameters are calculated. The surface texture analysis software shall include: Form removal to remove curvature and tilt from the profile Ability to exclude regions from form removal calculation Cut-off filtering to distinguish waviness from roughness Amplitude, spacing, and hybrid parameters for roughness and waviness The contour analysis software shall provide for calculation of basic dimensional analysis of radius, angle, length, and height. Accessories Vee block pair: for supporting long cylindrical parts Manual Y axis table: for small displacement, manual positioning of samples Reference measurement standards with certificates of calibration to include: ball, for arcuate calibration angle prism, for precise angle calibration step height Additional Stylii: for small bores (<2 mm) for deep recess (<25 mm) Stylus stop attachment to prevent stylus from dropping into recesses This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation, which is issued as a Request for Quotation (RFQ); quotes are being requested and a written solicitation will not be issued. Offerors are required to use the On-Line RFQ system to submit their quote. The On-line RFQ system is linked above or it may be accessed at http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=C&pin= . The information required by FAR Subpart 12.6 is included in the on-line RFQ. The Government intends to acquire a commercial item using FAR Part 12 and the Simplified Acquisition Procedures set forth in FAR Part 13. Questions regarding this acquisition must be submitted in writing (e-mail is preferred) no later than October 2, 2003. (Prospective quoters shall notify this office of their intent to submit a quotation). It is the quoter's responsibility to monitor this site for the release of amendments (if any). Potential quoters will be responsible for downloading their own copy of this notice, the on-line RFQ and amendments (if any). An ombudsman has been appointed - See NASA Specific Note "B". Any referenced notes may be viewed at the following URLs link below.
- Web Link
-
Click here for the latest information about this notice
(http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=D&pin=62#107597)
- Record
- SN00442977-W 20030928/030926213251 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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