SOLICITATION NOTICE
66 -- Atomic Force Microscope System
- Notice Date
- 8/22/2003
- Notice Type
- Solicitation Notice
- Contracting Office
- Department of Health and Human Services, National Institutes of Health, Nat'l Institute of Diabetes, Digestive, & Kidney Diseases, 2 Democracy Plaza, Suite 700W 6707 Democracy Blvd., MSC 5455, Bethesda, MD, 20892-5455
- ZIP Code
- 20892-5455
- Solicitation Number
- NIH-NIDDK-03-974
- Response Due
- 9/18/2003
- Archive Date
- 10/3/2003
- Point of Contact
- Diana Ly, Contract Specialist, Phone 301594-7730, Fax 301-480-8261,
- E-Mail Address
-
LyD@extra.niddk.nih.gov
- Description
- The National Institutes of Health (NIH), National Institute of Diabetes and Digestive and Kidney Diseases (NIDDK) has a requirement to purchase an Atomic Force Microscope (AFM) from Veeco Metrology LLC/DBA Digital Instruments, 112 Robin Hill Rd., Santa Barbara, CA 93117. The following accessories and specifications shall be included in the system: A) NanoScope IV SPM Control Station with the following: 1) Requires microscope and accessories appropriate for your application. Microscopes must be NanoScope IV-compatible to support full functionality. 2) Up to 10X faster topographical scanning and PhaseImaging in air with TappingMode+ than provided by conventional SPM controllers. Standard cantilevers can be used for scanning at conventional rates. 3) Includes Quadrex Extender Electronics with on-board lock-in amplifier for quantitative PhaseImaging, improved accuracy, and enhanced image contrast. 4) Provide OneScan imaging with more data points per scan line (=4000) for the highest resolution available. Allows zooming on large scans while maintaining nano-scale lateral resolution, without the need for repetitive smaller scans. 5) Q-control for enhanced force control, sensitivity and image contrast, and for studying tip-sample interactions. 6) User-available, low-noise analog feedback loop for some custom applications. 7) High-speed DSP and SPM-computer interface electronics. 8) Six analog-to-digital converters (ADCs, four user-available). 9) Four digital-to-analog converters (DACs) dedicated to Quadrex, and four DACs for other dedicated and user applications. 10) Allows easy access to line sync (end-of-line), frame sync (end-of-frame), and Quadrex lock-in oscillator reference signal. 11) High-speed serial interface for improved hardware/software, including comprehensive image analysis. 12) Windows NT-based SPM imaging software, including comprehensive image analysis. 13) 32-bit dual monitor color display video with effective total resolution 32048x768 pixels. 14) 16-bit resolution on all three scanning axes, regardless of scan size or offset. 15) Extremely flexible for adaptation to user-designed microscopes and/or custom applications. 16) Extensive and expanded real-time control of feedback and other parameters gives the user the freedom to design and execute novel SPM experiments with the advantage of the NanoScope?s precision and reliability. 17) Pentium tower-style PCI computer with twin 18-inch LCD monitors (110V/220V, 50/60 Hz, auto switching). 18) Includes ten micro-actuated probes (Model MMASPCH) if sold with MultiMode microscope. 19) Installation B) NanoScope Software & Computer with the following accessories and specifications: includes a minimum 2.4GHz Pentium 4 PCI, 61GB HD, 512MB RAM, 3.5-inch 1.44MB FD, CD R/W, 100MB Zip Drive, Windows NT operating system, NanoScope SPM Image and Image Analysis Software and network board. C) NanoScope MultiMode Atomic Force Microscope with the following accessories and specifications: 1) Performs contact and non-contact atomic force, lateral force and TappingMode (air) microscopy. 2) Performs magnetic force and electric force microscopy without additional hardware; however, the Quadrex Extender Electronics (Model Quadrex) or standard Extender Electronics Module (Model PHASE-01) are strongly recommended for the best possible images, including phase/frequency detection and surface potential measurements. 3) Will also perform force modulation (air and fluid), TappingMode (fluid), nanoindenting/scratching, scanning tunneling, electrochemical AFM, and electrochemical STM with additional accessories. 4) Includes new low noise head electronics for lowest possible noise and cleanest possible images when imaging in Q control with a NanoScope IV Control Station. 5) AFM optical head is compatible with on-axis optical viewing of tip placement on the sample, using any of the optional optical microscope systems. 6) XY Sample Stage with 2mm x 2mm range. 7) Accepts samples up to 15mm diameter and 6mm thick. 8) Includes 45X monocular microscope with laser safety filter for viewing the probe and sample. 9) Includes probe handling tools and sample pucks. 10) Includes 20 Silicon Nitride Probes (Model NP-20) and 10 Tapping Mode Etched Silicon Probes (Model RTESP). D) 10?m AFM Scanner with Vertical Engage for MMAFM, AFM, and LFM. This ?EV? type scanner provides X-Y range of 10?m x 10?m with 2.5?m vertical range and features a new design for vertical motion which eliminates tilt and lateral movement of the cantilever during engage. Fully motorized and computer controlled, minimizing manual adjustments. Includes patented dual piezo material bonded into a single piezo tube scanner with three-point microscope head support. E) Cantilever Holder for Scanning in Fluid (TappingMode, Force Modulation) with the MultiMode SPM, which will include: 1) Glass cantilever holder for fluid operation for contact mode, TappingMode, and Force Modulation. The cantiliver is acoustically driven by a separate piezo oscillator for larger amplitude modulation. 2) Includes 10 Oxide-Sharpened Silicon Nitride NanoProbes (Model NP-S), recommended for soft samples. F) Low-Cost Video-Only Microscope System (100V/120V), which must be: 1) Compatible with all Topview AFM, TipView STM and MultiMode configurations. 2) Allows optical imaging simultaneous with AFM, STM or MultiMode operation. 3) 10X Nikon objective (working distance = 49.5mm; numerical aperture 0.2; and resolutions of 1.6 ?m). 4) 450X magnification on a 13?-color display monitor. 5) Erect image (the optical image is not inverted horizontally or vertically). 6) 12.7mm travel two-axis stage. 7) Total vertical range of over 400mm. 8) Stable, vibration-isolated granite base (additional isolation pad required beneath AFM, STM or MultiMode microscopes for atomic resolution). 9) Sony high-resolution CCD color camera. 10) Sony 13-inch (330mm) color display monitor. 11) NTSC (100 to 120VAC) and PAL (240VAC) formats. 12) All cables and other accessories must be included. 13) CE compliant (PAL version) G) Three days Installation/Training at the Customer?s Site for New Systems. On-site installation and system operation/application training for three days. The Institute intends to purchase this equipment by other than full and open competition from Veeco Metrology LLC/DBA Digital Instruments. To the best of the Governments knowledge they are the sole manufacturer and distributor of this equipment. Interested vendors may identify in writing their interest with a capability statement to the contracting Officer prior to the closing date of this notice. This notice of intent is not a request for competitive proposals, however, all responses received before the closing date of this announcement will be considered by the Government. A determination by the Government not to compete this proposed acquisition is based upon responses to this notice and is solely within the discretion of the Government. Information received will be considered solely for the purpose of determining whether to conduct a competitive procurement. It is anticipated that Request for Quotation (RFQ) NIH-NIDDK-03-974 will be available fifteen (15) days after the publication date of this synopsis. Receipt of quotations will be due ten (10) days after the release of the RFQ. The anticipated award date is September 19, 2003. Request for copies of the RFQ must be in writing and may be FAXED to 301-480-8261. Quotations must be submitted in writing to the National Institute of Diabetes and Digestive and Kidney Diseases 6707 Democracy Blvd., Room 773, Bethesda, Maryland 20817 Attention: Diana Ly. FAX quotations must contain offerors names, address, telephone number and fax number. FAX quotations will only be accepted if dated and signed by an authorized company representative.
- Place of Performance
- Address: 9000 Rockville Pike, Bethesda, MD
- Zip Code: 20892
- Country: USA
- Zip Code: 20892
- Record
- SN00409736-W 20030824/030822213249 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
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