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FBO DAILY ISSUE OF JUNE 22, 2003 FBO #0570
SOURCES SOUGHT

66 -- BENCHTOP ENERGY DISPERSIVE X-RAY FLUORESCENCE SYSTEM(EDXRF)

Notice Date
6/20/2003
 
Notice Type
Sources Sought
 
Contracting Office
Department of Commerce, National Oceanic and Atmospheric Administration (NOAA), Mountain Administrative Support Center, 325 Broadway - MC3, Boulder, CO, 80305-3328
 
ZIP Code
80305-3328
 
Solicitation Number
NB814000304104KAR
 
Response Due
7/10/2003
 
Archive Date
7/25/2003
 
Point of Contact
Kelly Rima, Purchasing Agent, Phone 303-497-3779, Fax 303-497-3163,
 
E-Mail Address
Kelly.Rima@noaa.gov
 
Description
The U. S. Department of Commerce, National Institute of Standards and Technology (NIST) has a requirement for a benchtop (EDXRF) Energy Dispersive X-ray Fluorescence System. The following technical specifications are necessary to meet out program needs: 1) DETECTOR: Si PIN or better(energy resolution of at least 260eV) with a collection area of at least 10 mm squared. The detector must be electrically cooled (no liquid nitrogen cooling). The window on the detector must provide for analysis of elements at least as light as sodium. 2) X-RAY SOURCE: Adjustable excitation voltage of at least 10-35KV, Rh or W anode, at least 10 W tube power. The excitation area must be smaller than 1 cm squared. 3) SAMPLE HANDLIN: Ability to easily handle standard 75 mm and 100 mm wafers. Additionally it would be useful if samples as thick as 8 mm could be loaded for analysis. The ability to evacuate the sample area is optional but considered a plus. 4) PULSE PROCESSING, COMPUTER AND SOFTWARE: The system must include pulse processing electronics and a data acquisition computer. The computer must at a minimum control the data acquisition, collect spectra of fluorescent x-rays and perform standard compositional analyses. In addition to determining composition of mixed samples, it would be very useful if the software could perform thin-film thickness analyses. 5) PHYSICAL CHARACTERISTICS: It is preferable that the system fit on a desktop (less than 1 m wide by .75 m deep by .75 m high) although a floor standing unit (1 m wide by .75 m deep by 1.5 m high) is acceptable. The system must operate using a standard 115V 20A circuit. 6) PERFORMANCE CHARACTERISTICS: Because the performance of these systems depends greatly on the particular elements being studied, two example cases are specified. The system must be able to reproducibly determine the thickness of both layers of a Mo/Cu bilayer on a Si wafer (Mo on the bottom nominal 60 nm thickness, Cu nominal 200 nm thickness) with an uncertainty of less than plus or minus 1 nm after appropriate calibration. Additionally the system must be able to measure the Fe content in a 100 nm thick W film to better than 2 ppm with appropriate calibration. This procurement is being conducted per FAR Part 13, Simplified Acquisition Procedures (NTE $100K). The proposed procurement is non-restrictive, but small businesses will receive preference. Written quotes should address all of the technical specifications and will be received up to the close of business on July 10, 2003. Selection will be based upon technical merit and price. Any questions should be sent in writing to Kelly.Rima@noaa.gov. FAR Clauses in full text are available at http://www.ARNET.gov/far/. Agency level protest procedures can be found on web site http://oamweb.osec.doc.gov/CONOPS/#REFERENCE. Hard copy in full text available from office address and phone number listed in notice. Anticipated award date July 14, 2003.
 
Record
SN00353059-W 20030622/030620213546 (fbodaily.com)
 
Source
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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