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FBO DAILY ISSUE OF MAY 25, 2003 FBO #0542
SOLICITATION NOTICE

66 -- Scanning Probe Microscope

Notice Date

5/23/2003
 

Notice Type

Solicitation Notice
 

Contracting Office

US Army Robert Morris Acquisition Center, Adelphi Contracting Division, ATTN: AMSSB-ACA, 2800 Powder Mill Road, Adelphi, MD 20783-1197
 

ZIP Code

20783-1197
 

Solicitation Number

DAAD17-03-T-0097
 

Response Due

6/4/2003
 

Archive Date

8/3/2003
 

Point of Contact

Gregory Davies, 410-278-6809
 

E-Mail Address

Email your questions to US Army Robert Morris Acquisition Center, Adelphi Contracting Division
(gdavies@arl.army.mil)
 

Small Business Set-Aside

N/A
 

Description

NA The Army Research Laboratory, Aberdeen Proving Ground, MD is plans to buy a Scanning Probe Microscope (quantity of one each plus supporting accessories). The contract will be firm-fixed price. The anticipated award date is June 2003. This action is a full and open competition and is unrestricted as to business size. The NAICS code for this action is 334516; the SIC code is 3826. This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR 12.6, as supplement ed with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. This action is issued as a request for proposal (RFP). The solicitat ion number is DAAD17-03-T-0097. The solicitation document and incorporated provisions and clauses are those in effect through Federal Acquisition Circular (FAC) 2001-09. This purchase will be made under the test procedures for the procurement of commercial items under the authority of FAR 13.5. ARL??????s statement of requirements for the microscope is as follows: The Molecular Electronics and Sensors research at the Army Research Laboratory is focused on developing molecular-scale electronics and sensors elements for nanoelectronics and chem-biosensors to support the OFW of FCS. The research involves designing mole cular electronics and sensor devices, assembling them on nanoscale architecture and characterizing the fundamental device characteristics. The tool for characterizing and probing molecular-scale devices are tunnel microscopes and force microscopes in add ition to very low-noise, high-frequency electrometers. An essential tool for aligning molecular structure in device configurations on a nano-scale solid substrate is the controlled writing (lithography) of molecules on the substrate in a predetermined conf iguration. This can be accomplished by the recently developed Dip-Pen Nanp-lithography (DPN) on the substrate in a variety of device pattern. A software controlled DPN technique, with the ability to interfacing the embedded software with external pattern and script language is an essential requirement for our device configuration. The DPN will be used to WRITE and READ molecular architectures and circuits on a variety of nano-scale solid structures themselves created by STM tip and direct-write electron be am lithography at ARLs E-beam facility. In view of our experiment requirement, the surface probe microscope system should have the following capabilities: DPNWrite Dip-Pen Nanolithography Software Must have the open software controlled DPNWrite and Dip-Pen Nanplithography capability. Must have the Multiple ink registration capability Must have the line width of 12 nm or less. Must have the spatial resolution of 5 nm or less. The Nanolithography Software Must be able to import Bitmap files Must be able to import any mathematics functions Must have the script language capability Must be able to translate any Nanolithography objects to script language The sample stage- Should accept sample sizes up to 2 in. x 2 in. in width and 1 inch in height Should offer an open view/design/access for customized SPM experiment in conjunction with external light source/fiber The acquisition Software- Should be able to collect 8 data channels simultaneously in either one or both directions Should have generalized multi-channel spectroscopy capability The embedded electronics- Must have 20-bit digital-to-analog converters Must be able to choose between an RMS detector and a single phase lock-in amplifier for amplitude measurement in Non-contact AFM Must have the open access to up to 61 I/O signal channels The scanner- Must have closed loop scan linearizers to compensate for piezo historesis, creep and non-linearlities. Only software correction is unacceptable Must have unipolar voltage controls for X,Y and Z in order to avoid scanner depolarizati on In the overall performance- Must be able to achieve atomic resolution with 100 um scanner on graphite Addition needs for convenience of measurement and little user intervention are: Be capable of working in AFM, STM, LFM, FMM, PFM, CAFM, SThM, MFM, EFM, SEPM, and SCM modes without changing and removing the scan head Should have pre-mounted and pre-aligned cantilevers for easy and quick tip exchange Should allow convenient way to change cantilevers without removing scan head The technical POC for this requirement is: Dr. Shashi P. Karna, WMBD, Tel: 410-306-0723, Fax: 410-306-1909, Email: skarna@arl.army.mil The acceptance and FOB point is Destination. Delivery shall be made to U.S. Army Research Laboratory, ATTN: AMSRL-WMBD, Bldg. 434, Aberdeen Proving Ground, MD 21005-5001. Final acceptance of this system will be made only after unit is assembled, tested, and found compliant by the Government end user. Evaluation Criteria: Timely proposals will be evaluated in accordance with FAR 52.212-2, Evaluation,Commercial Items. The Government will award a contract resulting from this solicitation to the responsible offeror whose offer conforming to the solicitat ion will be most advantageous to the Government, price and other factors considered. Contracting Officer shall make a best value award decision based on the following evaluation factors: 1. Technical capability of the item offered to meet the Government requirement; and 2. Price. Technical capability is more important than price, and the contracting officer may not make award to the lowest priced offeror. The Government reserves the right to make an award without discussions. The technical capability evaluation will be a determination of the offerors ability to meet or exceed the stated requirements. and shall be based on information furnished by the offeror. The government is not responsible for locating or securing any infor mation that is not identified in the proposal. To ensure sufficient information is available, vendors must furnish as part of their proposal all descriptive material necessary for the Government to determine whether the product(s) meets technical requirem ents. Offerors shall include a completed and signed copy of the provision at FAR 52.212-3, Offeror Representations and Certifications - Commercial Items (APR 2001) with its offer. The clause DFARS 252.212-7000 (JUL 1997), Offeror Representations and Cert ifications, applies to this acquisition. The clause at FAR 52.212-4, Contract Terms and Conditions - Commercial Items, applies to this acquisition. The clause at FAR 52.212-5, Contract Terms and Conditions Required to Implement Statutes or Executive orde rs - Commercial Items, applies to this acquisition. The following additional FAR/DFARS clauses cited in this clause are applicable: Restriction on Subcontractor Sales to the Government (JUL 1995); FAR 52.219.8, Utilization of Small Business Concerns (OCT 2000); FAR 52.222-21, Prohibition of Segregated Facilities (FEB 1999); FAR 52.222-26, Equal Opportunity (FEB 1999); FAR 52.222-35, Affirmative Action for Disabled Veterans and Veterans of the Vietnam Era (APR 1998); FAR 52.222-36, Affirmative Action for W orkers with Disabilities (JUN 1998); FAR 52.222-19, Child Labor-Cooperation with Authorities; FAR 52.223-9 Estimate of Percentage of Recovered Material Content for EPA Designated Products; FAR 52.232-33, Payment by Electronic Funds Transfer (MAY 1999), DFA RS 252.204-7004, Required Central Contractor Registration; DFARS 252.225-7001, Buy America Act and Balance of Payments Program, DFARS 252.227-7015, Technical Data-Commercial Items (NOV 1995); DFARS 252.227-7037, Validation of Restrictive Markings on Techni cal Data (SEP 1999) . Clauses and provisions are incorporated by reference and apply to this acquisition. Clauses and provisions can be obtained at http://www.arnet.gov. Proposals are due at 1600 EST, June 4, 2003, via email to RMAC-Adelphi@arl.army.mi l. Offerors m ust cite the solicitation number in the subject line. Proposals received after this date and time will be considered non-responsive. The Contracting Officer for this solicitation is Mr. Greg Davies, telephone 410-278-6809/email gdavies@arl.army.mil. The mailing address for the contracting officer is U.S. Army Research Laboratories, Aberdeen Branch, Bldg. 434, Suite 200, AMSSB-ACC-AA, Aberdeen Proving Ground, MD 21005.
 

Place of Performance

Address: US Army Robert Morris Acquisition Center, Adelphi Contracting Division ATTN: AMSSB-ACC-AA, Aberdeen Proving Gr. MD

Zip Code: 21005

Country: US
 

Record

SN00331734-W 20030525/030523213529 (fbodaily.com)
 

Source

FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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