SOLICITATION NOTICE
52 -- UPGRADE TO ENERGY DISPERSIVE X-RAY SPECTROSCOPY SYSTEM
- Notice Date
- 6/27/2002
- Notice Type
- Solicitation Notice
- Contracting Office
- NASA/Glenn Research Center, 21000 Brookpark Road, Cleveland, OH 44135
- ZIP Code
- 44135
- Solicitation Number
- 3-198427
- Response Due
- 7/2/2002
- Archive Date
- 6/27/2003
- Point of Contact
- Deborah L. Volan, Contract Specialist, Phone (216) 433-5420, Fax (216) 433-2480, Email Deborah.L.Volan@grc.nasa.gov
- E-Mail Address
-
Email your questions to Deborah L. Volan
(Deborah.L.Volan@grc.nasa.gov)
- Description
- This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; quotes are being requested and a written solicitation will not be issued. NASA/GRC intends to purchase the items from: IXRF Systems located in Houston, TX 77059. THIS IS A SOLE-SOURCE PROCUREMENT. THIS NOTICE IS FOR INFORMATION PURPOSES ONLY. SOLE SOURCE JUSTIFICATION: This procurement is for the upgrade of a NASA-owned energy dispersive x-ray spectroscopy system. The new digital pulse processor/digital imaging module must be compatible with existing IXRF EDS2000 operating software and PCI interface. IXRF is the only contractor that has access to the proprietary computer code to be compatible with this system. This procurement is being conducted under the Simplified Acquisition Procedures (SAP). DESCRIPTION: Item (1): Upgrade of NASA owned energy dispersive x-ray spectroscopy system as specified. System includes new digital pulse processor, digital imaging module, and PCI interface. System to be compatible with a PGT Model OPJ031-1033 detector and JEOL 6100 SEM. Manufacturer: IXRF, Model No: EDS2000, Quantity: 1 each Item (2): Upgrade of NASA owned energy dispersive x-ray spectroscopy system as specified. System includes new digital pulse processor and digital imaging module. System to interface to a JEOL 840A and FISONS Model 3600-0178 Detector. Manufacturer: IXRF, Model NO: 500, Quantity: 1 each SPECIFICATIONS: This procurement is for the upgrade of a NASA owned energy dispersive x-ray system that consists of a PGT Model OPJ031-1033 detector on a JEOL 6100 scanning electron microscope. System shall be installed on a NASA owned Dell computer. 1. Hardware 1.1 The system shall include a digital pulse processor with the following minimum features; a. Programmable gain and pulse pileup rejection. b. Programmable time constants 0.3, 0.5, 1, 2, 4, 8, 16, 32 (microseconds). c. 32-bit, 4096 channel multi-channel analyzer (MCA) PCI interface card. d. Automatic energy calibration. e. Adjustable detector bias. f. Liquid nitrogen monitor with bias shutdown for detector warm up protection. g. Digital pulse processor logic is downloaded from the PC for simple field upgrades. h. Built in, on board oscilloscope. i. Voltage 100/120/220/240 V AC user selectable. 47-63 Hz. j. All cables/hardware to interface to a PGT Model OPJ031-1033 detector. k. No loss of detector resolution. Resolution to be checked before installation of new system. 1.2 The system shall include a digital imaging module with the following minimum features; a. Acquisition of gray scale in 12-bit resolution. b. Acquire images at up to 4096 x 4096 resolution. c. AC line voltage synchronization. d. Ability to acquire non-square images. e. Image pixel averaging: 2, 4, 8, or 16. f. Image frame averaging. g. All cables/hardware required for interfacing to a JEOL 6100. 2.0 Software 2.1 X-ray energy dispersive spectroscopy software shall have the following minimum features; a. Collection of spectra into 25 (maximum) individual windows. b. 0 to 40 keV spectral range at 10 eV per channel. c. One click operation for acquisition, automatic peak identification, customizable spectrum processing, and quantification. d. Text overlay on spectra that can be saved with spectra. e. Export of spectra to standard image file formats (e.g., TIFF, JPEG). f. Point and click cursor displays energy, counts, and possible elements present. g. Customizable automatic element identification and labeling of peak. h. Identification of peaks through periodic table or elemental buttons. i. Customizable spectrum display (colors and fonts) for both on-screen display and printing. j. Complete customization of analysis report output. k. Microscope geometry setup and take-off angle calculator. l. Detector crystal and window setup calculator. m. Spectral overlay for comparison or background removal. n. One-click quantitative analysis. o. Automatic sum and escape peak removal. p. Automatic correction for background using one of four background removal methods. q. Automatic peak-overlap correction using Linear or non-linear gaussian deconvolution (no pre-acquired peak profiles required). r. K-ratio determination. s. Automatic standardless quantification using ZAF (SEM) and Cliff-Lorimer (TEM) algorithms including correction for inter-element effects. t. Full capability for analysis with pure-element standards, compound standards, or standardless, or any combination. u. Qualitative spectral matching using stored spectra. v. Quantitative spectral matching using standards. w. Analysis settings files store all quantitative analysis settings, ensuring consistent, repeatable analysis of each sample type. x. Combine multiple analyses into a single tabulated report. y. Component calculator provides quantitative analysis with compounds (e.g., oxides) 2.2 Digital imaging software shall have the following minimum features; a. Display images at 24-bit color resolution (16.7 million colors). b. Image file browser displays "thumbnail" view of files for easy selection. c. Annotate images with a variety of sophisticated interactive measurement tools. d. Export images to standard image file formats (e.g., TIFF, JPEG). e. Import images from a variety of image formats (TIFF, JPEG, etc). f. Multi-point analysis software for unattended spectral data collection and processing. from selected points and/or areas on an image. g. Adjustable micron marker and kV displayed on image. h. Imaging hardware and software calibrated to SEM magnification. i. Brightness, contrast, and customized color palette adjustments. j. Display of image gray level histogram. k. Crop/zoom Images. l. One-click acquisition of x-ray maps; simply label the peaks on the spectrum and select the x-ray map button. m. Mapping and linescan routines to store all spectral data and their locations. n. Maximum x-ray map resolutions (per element) is 2048 x 2048. o. Rapid and flexible map acquisitions using point dwell times as short as 10 microseconds. p. Live spectrum display during x-ray map acquisitions. q. Maps are displayed in 24-bit color. r. Simultaneous acquisitions of 31 x-ray maps with SEM image. s. Composite maps provide overlaying of maps on the SEM image. t. Real-time quantitative analysis display at each map pixel. u. Multiple frame x-Ray maps for higher precision maps frame averaging. v. Definable phase mapping by weight percent. w. Create additional element x-ray maps and linescans without re-acquiring the x-ray map using the stored spectra. x. Export X-ray maps to standard image files (e.g., TIFF, JPEG) or ASCII 2.3 Image analysis software shall have the following minimum features; a. Image processing steps are stored with the image macro recorder. b. Border particle removal. c. Particle sorting by dimensional criteria. d. Particle exclusion by feature measurements. e. Particle classification by chemical composition (EDS data). f. Electron-beam control for feature scanning or spot-mode analysis. g. Histogram equalization. h. User definable kernels of 3x3, 5x5, 7x7 and 9x9 formats. i. Erosion, dilation, hole filling, and skeletonization. j. Smoothing, sharpening, median filtering. k. Sobel, Laplace, vertical, and horizontal edge filtering. l. Binarization of images. m. Morphological processing. n. Customizable report generation including histograms and scatter plots. o. All data, optionally including the image and EDS spectra, are stored in the database. 3.0 Installation and miscellaneous a. System installation, travel, travel time, food, and lodging shall be included. b. Contractor shall be responsible for disconnecting old hardware after verification of detector resolution. c. Contractor shall be responsible for costs for consultation with JEOL or PGT if required. d. Installation shall include calibration of the x-ray spectra and image magnifications. e. Contractor shall provide four hours of on-site training. f. System shall include free software upgrades via the internet for the life of the system. The provisions and clauses in the RFQ are those in effect through FAC 97-07. This procurement is a total small business set-aside. The NAICS Code and the small business size standard for this procurement are 334519 and 500, respectively. The quoter shall state in their quotation their size status for this procurement. All qualified responsible business sources may submit a quotation which shall be considered by the agency. Delivery to NASA Glenn Research Center is required by July 30, 2002. Delivery shall be FOB Destination. The DPAS rating for this procurement is DO-C9. Quotations for the items(s) described above are due by COB on July 2, 2002 and may be faxed to Debbie Volan, FAX: (216) 433-2480, and include, solicitation number, FOB destination to this Center, proposed delivery schedule, discount/payment terms, warranty duration (if applicable), taxpayer identification number (TIN), identification of any special commercial terms, and be signed by an authorized company representative. If the end product(s) quoted is other than domestic end product(s) as defined in the clause entitled "Buy American Act -- Supplies," the quoter shall so state and shall list the country of origin. The Representations and Certifications required by FAR 52.2l2-3 may be obtained via the internet at URL: http://ec.msfc.nasa.gov/msfc/pub/reps_certs/sats/ The FAR may be obtained via the Internet at URL: http://www.arnet.gov/far/ The NFS may be obtained via the Internet at URL: http://www.hq.nasa.gov/office/procurement/regs/nfstoc.htm Award will be based upon overall best value to the Government, with consideration given to the factors of proposed technical merits, price and past performance; other critical requirements (i.e., delivery) if so stated in the RFQ will also be considered. Unless otherwise stated in the solicitation, for selection purposes, technical, price and past performance are essentially equal in importance. It is critical that offerors provide adequate detail to allow evaluation of their offer (see FAR 52.212-1(b). Quoters must provide copies of the provision at 52.212-3, Offeror Representation and Certifications - Commercial Items with their quote. See above for where to obtain copies of the form via the Internet. An ombudsman has been appointed - See NASA Specific Note "B". Prospective quoters shall notify this office of their intent to submit a quotation. It is the quoter's responsibility to monitor the following Internet site for the release of amendments (if any): http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=C&pin=22 Potential quoters will be responsible for downloading their own copy of this combination synopsis/solicitation and amendments (if any). Any referenced notes can be viewed at the following URL: http://genesis.gsfc.nasa.gov/nasanote.html
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