SOLICITATION NOTICE
66 -- Near-Field Scanning Optical Microscope
- Notice Date
- 6/5/2002
- Notice Type
- Solicitation Notice
- Contracting Office
- Department of Commerce, National Oceanic and Atmospheric Administration (NOAA), Mountain Administrative Support Center, 325 Broadway - MC3, Boulder, CO, 80303-3328
- ZIP Code
- 80303-3328
- Solicitation Number
- Reference-Number-NB815040204065
- Response Due
- 6/20/2002
- Archive Date
- 7/5/2002
- Point of Contact
- Susan Labovitz, Contract Specialist, Phone (303) 497-7943, Fax (303) 497-3163, - Brenda Summers, Contract Technician, Phone (303) 497-5588, Fax (303) 497-3163,
- E-Mail Address
-
susan.labovitz@noaa.gov, brenda.s.summers@noaa.gov
- Description
- Synopsis for Near-field Scanning Optical Microscope (NSOM). In the absence of other qualified sources, it is the intent of the National Institute of Standards & Technology (NIST) to acquire a Near-field Scanning Optical Microscope from Nanonics Imaging, Ltd., The Manhaat Technology Park, Malcha, Jerusalem, Israel. An NSOM is a computer-controlled optical instrument that measures and maps light emission (or reflection) from a surface under test and operates with a spatial resolution that is shorter than the wavelength of the light sensed. NIST needs this instrumentation for its new efforts in developing correlated nanoscopic measurement methods for epitaxially-grown films of wide-bandgap semiconductors. Development of the wide-bandgap III-nitride material technology, for applications spanning both solid-state lighting technology and homeland security needs, depends upon developing radically new metrology methods that enable spectroscopic analysis of the following materials on the scale of the defect separation. Materials include alloys of aluminum gallium nitride (A1GaN), indium gallium nitride (InGaN) and compounds that combine both of these alloy materials (also known as the wide-bandgap III nitrides). NIST requires that the NSOM instrumentation have specialized capabilities such as ultraviolet operation and independent control of optical fiber tips and sample stage motion. It is absolutely essential that the NSOM instrument allow independent motion of the stage assembly that holds the sample under test and the stage assembly that moves the collection fiber tip. Furthermore, this independent stage motion must be computer controlled with nanometer-scale resolution. This flexibility in operation will allow essential pump-probe experiments whereby the sample can be moved to various locations relative to a fixed pump beam and the optical fiber probe can then be used to scan and map the spectroscopy of the defects in these fixed locations. Nanonics is the only known vendor, who has demonstrated NSOM instrumentation that has the following specific features required by NIST: I. Unique minimum requirements relating to translation of the sample, translation of the NSOM probe tip, sample holders, and fiber tips are: (i) Independent piezoelectric scanning ability of sample and probe stages is required. The separate piezo-drive stage systems, that will support the sample under test and the NSOM optical fiber probe tip, will be independent. This independent motion will allow for at least 60 micrometers of repeatable transverse scanning (x-y) and least 60 micrometers of repeatable axial (z) scanning of both the sample stage and the NSOM probe tip. (ii) Coarse sample position adjustment (mechanical, non-piezo) of at least 5 mm (x and y directions) is required. (iii) At least five separate sample holders that adapt to the NSOM stage assembly. (iv) At least three NSOM tip mounts for atomic force microscope (AFM) modes of operation and one mount for a straight tip. (v) At least 25 cantilevered fiber near-field imaging probe tips that provide optical transmission down to a UV optical wavelength of 193 nm. (vi) User manual that includes schematics and block diagrams specific to the instrument. II. Unique minimum requirements relating to optical accessibility of optical fiber tip and sample stage assembly are: (i) Compatibility with standard microscopes is required. The tip/sample stage assembly will be designed to allow ready optical access of the sample under test and will be compatible with standard optical microscopes. In particular the tip/sample stage assembly will be compatible with standard par-focal microscope nose-pieces so that focus and alignment of an inspection microscope can be maintained with the interchange of objectives by rotating the nose-piece of the microscope without the need to change sample alignment. (ii) The NSOM tip/stage assembly must support either a curved-cantilevered or a straight fiber tip. In order to enhance optical access from above the sample stage, the option to switch between either a curved-cantilevered or a straight NSOM optical fiber probe tip is necessary. Here, "curved-cantilevered NSOM optical fiber probe tip" means a tip that can access the sample under test from the side without interfering or blocking the objective of an inspection microscope looking down on the sample from above the stage assembly. This requirement is stringent since microscope objectives of various magnifications and working-distances will be routinely used. Here, the typical fiber cantilever length required is 0.4 mm to 1.0 mm and the fiber cantilever height required is 0.05 mm to 1.00 mm. Furthermore, the vendor must be able to supply NSOM tips, both straight and cantilevered, that provide an optical transmission of least 50%/m at 193 nm wavelength. (iii) An open aperture of at least 20 mm in diameter is required for optical access to the sample under test. This accessibility must be possible from both the bottom and the top of the sample. (iv) Flexibility of the tip/stage assembly to allow ready optical access to a sample from the bottom (opposite side of the sample from that which is scanned by the NSOM tip). The design of the tip/stage assembly must be sufficiently open in order to allow bulk-optical access by one or more laser beams to the bottom of the sample. Specifically, the platform assembly supporting the NSOM stage system must allow for at least 20 cm of clearance between the bottom of the support platform and the surface of the optical table. This acquisition is for a commercial item. Interested concerns must submit a written qualification statement that clearly establishes the firm's capability to meet the above requirements. This qualification statement shall be submitted to the individual and office cited above within 15 days from the date this synopsis is posted on the Internet. This is not a formal solicitation.
- Place of Performance
- Address: Nanonics Imaging Ltd., The Manhat Technology Park, Malcha, Jerusalem
- Country: Israel
- Country: Israel
- Record
- SN00088198-W 20020607/020605213937 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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