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FBO DAILY ISSUE OF MAY 10, 2002 FBO #0159
SOLICITATION NOTICE

93 -- H-SIC PRODUCTION GRADE WAFERS

Notice Date
5/8/2002
 
Notice Type
Solicitation Notice
 
Contracting Office
NASA/Glenn Research Center, 21000 Brookpark Road, Cleveland, OH 44135
 
ZIP Code
44135
 
Solicitation Number
3-187437
 
Response Due
5/20/2002
 
Archive Date
5/8/2003
 
Point of Contact
Jean M. Boylan, Purchasing Agent, Phone (216) 433-2140, Fax (216) 433-2480, Email Jean.M.Boylan@grc.nasa.gov
 
E-Mail Address
Email your questions to Jean M. Boylan
(Jean.M.Boylan@grc.nasa.gov)
 
Description
This procurement is being conducted under the Simplified Acquisition Procedures (SAP). 1.) 4H-SIC P-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 8 DEG. OFF AXIS. RESISTIVITY 4-5 OHM-CM, SILICON FACE. EPI: N-TYPE, >2E19, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W4PPD8G 00SI QUANTITY REQUIRED: 1 LOT 2.) 6H-SIC P-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 3.5 DEG OFF AXIS; RESISTIVITY >5 OHM-CM; SILICON FACE; EPI: N-TYPE, > 2E19, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W6PPD3P 00SI QUANTITY REQUIRED: 1 LOT 3.) 6H-SIC N-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 3.5 DEG. OFF AXIS, >5 OHM-CM, SILICON FACE. ONE EPI: N-TYPE 1-2E19, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W6PPD3P-00SI QUANTITY REQUIRED: 1 LOT 4.) 4H-SIC N-TYPE, PRODUCTION GRADE, 2-INCH DIAMETER, 8 DEG OFF AXIS, 4-5 OHM-CM RESISTIVITY; EPI: N-TYPE, 1-2E19. SILICON FACE. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W4PPD8DG-00SI QUANTITY REQUIRED: 1 LOT 5.) 4H-SIC N-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 8 DEG OFF AXIS, 4-5 OHM-CM RESISTIVITY; SILICON FACE; EPI: 5-10E18, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W4PPD8DG-00SI QUANTITY REQUIRED: 1 LOT 6.) 4H-SIC N-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 8 DEG OFF AXIS, 4-5 OHM-CM RESISTIVITY; SILICON FACE; EPI: 2.5-7.5E17, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W4PPD8DG-00SI QUANTITY REQUIRED: 1 LOT 7.) 6H-SIC N-TYPE, PRODUCTION GRADE, 2-INCH DIAMETER, 3.5 DEG. OFF AXIS; RESISTIVITY >5OHM-CM, SILICON FACE; EPI: 2.5-7.5E17, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W6PPD3P-00SI QUANTITY REQUIRED: 1 LOT 8.) 6H-SIC N-TYPE, PRODUCTION GRADE, 2-INCH DIAMETER, 3.5 DEG. OFF AXIS; RESISTIVITY >5OHM-CM, SILICON FACE; EPI: 5-10E18, 2 MICRONS. MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W6PPD3P-00SI QUANTITY REQUIRED: 1 LOT 9.) 4H-SIC N-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 8 DEG OFF-AXIS; ONE WAFER 0.016 OHM-CM (~1E19 NET DOPING DENSITY) AND ONE WAFER 0.024OHM-CM (~5E18 NET DOPING DENSITY), LOW MICROPIPE DENSITY (<= 2/CM2), SILICON FACE. EPILAYERS: MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W4NPD8C-LOT2 QUANTITY REQUIRED: 1 LOT 10.) 4H-SIC N-TYPE, PRODUCTION GRADE, 2 INCH DIAMETER, 8 DEG OFF-AXIS; ONE WAFER 0.046 OHM-CM (1.8E18 NET DOPING DENSITY); LOW MICROPIPE DENSITY (<=15/CM2); SILICON FACE. EPILAYERS MANUFACTURER: CREE RESEARCH, INC. MODEL NO: W4NPD8C-LOT2 QUANTITY REQUIRED: 1 LOT NASA/GRC intends to purchase the items from Cree Inc.. THIS IS A SOLE SOURCE. NASA Glenn Research has been developing silicon carbide as a high temperature semiconductor material for many years. It is essential that crystal growth experiment be carefully controlled so that valid comparison of results can be made. NASA uses commercial SIC single crystal wafers as substrates in crystal growth experiments. A SIC-proprietary process produces the requested product. In order to obtain results that are consistent and comparable with prior experiments, the wafers specified in the particular solicitation must be obtained from Cree Inc. The provisions and clauses in the RFQ are those in effect through FAC 01-6. The NAICS Code and the small business size standard for this procurement are 334413 and 500, respectively. . The FAR may be obtained via the Internet at URL: http://www.arnet.gov/far/ The NFS may be obtained via the Internet at URL: http://www.hq.nasa.gov/office/procurement/regs/nfstoc. Government's requirement. An ombudsman has been appointed - See NASA Specific Note "B".
 
Web Link
Click here for the latest information about this notice
(http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=D&pin=22#101374)
 
Record
SN00073872-W 20020510/020508213420 (fbodaily.com)
 
Source
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

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